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Documents Evolution and Prospect of Single-Photon Avalanche Diodes and Quenching Circuits Politecnico di...

Slide 1Evolution and Prospect of Single-Photon Avalanche Diodes and Quenching Circuits Politecnico di Milano, Dip. Elettronica e Informazione, Milano, Italy S. Cova, M. Ghioni,…

Documents Laboratory for Sub-100nm Design Department of Electrical and Computer Engineering Novel dual-V th...

Slide 1Laboratory for Sub-100nm Design Department of Electrical and Computer Engineering Novel dual-V th independent-gate FinFET circuits Masoud Rostami and Kartik Mohanram…

Documents IndDG: A New Model for Independent Double-Gate MOSFET Santanu Mahapatra Nano-Scale Device Research.....

Slide 1indDG: A New Model for Independent Double-Gate MOSFET Santanu Mahapatra Nano-Scale Device Research Lab Indian Institute of Science Bangalore Email: [email protected]

Technology Japan nov 2010_kvick

1. MAX IV – An ultra-brilliant synchrotron radiation facility Our vision: A Nordic – Baltic laboratory Åke Kvick, MAX-lab, Lund, Sweden 2. Synchrotron radiation produced…

Technology Japan nov 2010_kvick

1. MAX IV – An ultra-brilliant synchrotron radiation facility Our vision: A Nordic – Baltic laboratory Åke Kvick, MAX-lab, Lund, Sweden 2.…

Documents Comparison among modeling approaches for gate current computation in advanced gate stacks ARCES:...

Slide 1Comparison among modeling approaches for gate current computation in advanced gate stacks ARCES: N.Barin, C.Fiegna, E.Sangiorgi BU: P.A.Childs FMNT-CNRS: D.Brunel,…

Documents Resonant Tunneling Diodes (RTDs) Ni, Man EE 666 Advanced Electronic Devices April 26, 2005.

Slide 1 Resonant Tunneling Diodes (RTDs) Ni, Man EE 666 Advanced Electronic Devices April 26, 2005 Slide 2 Outline Introduction RTD basics RTDs in different material systems…

Documents Part 0 Intro

Hetero-structure FETs: Modeling, Characterization and Analysis Introduction Mehdi Anwar University of Connecticut Material Properties: Heterojunction Material/Device Fundamentals…

Documents IEEE Central NC EDS/MTT/SSC Society Friday, Nov. 5th, 2010 The Nanoscale MOSFET: Physics and Limits....

Slide 1 IEEE Central NC EDS/MTT/SSC Society Friday, Nov. 5th, 2010 The Nanoscale MOSFET: Physics and Limits Mark Lundstrom 1 Electrical and Computer Engineering and Network…

Documents Radiation induced charge trapping in ultra-thin HfO 2 based MOSFETs

Radiation induced charge trapping in ultra-thin HfO2 based MOSFETs S.K. Dixit1, 2, X.J. Zhou3, R.D. Schrimpf3, D.M. Fleetwood3,4, S.T. Pantelides4, G. Bersuker5, R. Choi5,…