Slide 1 Analytical Modeling of RF Noise in MOSFETs – A Review S. Asgaran and M. Jamal Deen Electrical and Computer Engineering, CRL 226 McMaster University, Hamilton, ON…
Novel high-k materials Can we nominate candidates for the 22 and the 16 nm nodes? Olof Engstrom Chalmers University of Technology Paul Hurley Tyndall National Institute Octavian…