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Slide 1 Department of Semiconductor Detectors HEPHY Scientific Advisory Board 21 Oct. 2010 Thomas Bergauer Slide 2 Department of Semiconductor Detectors Thomas Bergauer21…
C‑V Characterization of MOS Capacitors Using the Model 4200‑SCS Semiconductor Characterization System Introduction Maintaining the quality and reliability of gate oxides…
P.G. Pelfer University of Florence and INFN, Firenze, Italy F. Dubecky Institute of Electrical Engineering, Slovak Academy of Sciences Bratislava, Slovakia A.Owens ESA/ESTEC…
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