Effects of Switched-Bias Annealing on Charge Trapping in HfO2 high- Gate Dielectrics X. J. Zhou,a D. M. Fleetwood,a L. Tsetseris,b R. D. Schrimpf,a S. T. Pantelidesb a…
High-Resolution and Rapid Updating Data Assimilation for STEP: WRF 3D-Var and RT-FDDA Testing and Comparison Using IHOP Data Mei Xu, Jamie Wolff and Michelle Harrold National…
Effects of Switched-Bias Annealing on Charge Trapping in HfO2 high- Gate Dielectrics X. J. Zhou,a D. M. Fleetwood,a L. Tsetseris,b R. D. Schrimpf,a S. T. Pantelidesb a…