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Education 1994 atomic structure of longitudinal sections of a pitch based carbon fiber studied by stm

1. appliedsurface science ELSEVIER Applied Surface Science 74 (1994) 73-80 Atomic structure of longitudinal sections of a pitch-based carbon fiber studied by STMP.W. de Bont…

Technology Maidana - Modification of particle accelerators for cargo inspection applications

1. Design, Modeling and Simulations of a Cabinet Safe System for a Linear Particle Accelerator of intermediate low energy by optimization of the beam optics. Carlos O. Maidana,…

Documents Optimization of STM

Optimization of STM-tip preparation methods ATHANASIOS REVENIKIOTIS Master of Science Thesis in Microelectronics and Applied Physics Stockholm, Sweden December 2010 Supported…

Documents Denisa Kera National University of Singapore facebook.com/DenisaKera nus.academia.edu/DenisaKera...

Slide 1 Denisa Kera National University of Singapore facebook.com/DenisaKera nus.academia.edu/DenisaKera Open Science & Hardware: patent zombies, chimeras and future…

Documents Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods.

Slide 1 Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods Slide 2 SPM Principle Probes that are nanosized (accomplished microlithographically), scanning…

Documents BMFB 3263 Materials Characterization Scanning Probe Microscopy & Relates Techniques Lecture 5 1.

Slide 1 BMFB 3263 Materials Characterization Scanning Probe Microscopy & Relates Techniques Lecture 5 1 Slide 2 SPM is a technique to examine materials with a solid probe…

Documents P. Grutter STM as a Tool to Understand the Electronic Properties of Molecules Peter Grutter Physics....

STM as a Tool to Understand the Electronic Properties of Molecules Peter Grutter Physics Department McGill University Part of SPM lecture series in 534A ‘Nanoscience and…

Documents Scanning Probe Microscopy – the Nanoscience Tool

Scanning Probe Microscopy – the Nanoscience Tool Tools that operate in real space with Ångstrom to nanometer spatial resolution, in contrast to scattering techniques,…

Documents Undergraduate Nanoelectronics Laboratory at the University at Buffalo and Demonstration V. Mitin

Undergraduate Nanoelectronics Laboratory at the University at Buffalo and Demonstration V. Mitin Electrical Engineering Department University at Buffalo, Buffalo, NY 14260-1920,…

Documents BMFB 3263 Materials Characterization

BMFB 3263 Materials Characterization Scanning Probe Microscopy & Relates Techniques Lecture 5 * SPM is a technique to examine materials with a solid probe scanning the…