Slide 1©2004 Brooks/Cole FIGURES FOR CHAPTER 16 SEQUENTIAL CIRCUIT DESIGN Click the mouse to move to the next page. Use the ESC key to exit this chapter. This chapter in…
Slide 11 Testing - Overview MotivationMotivation –fault models –testing methods Automatic Test Pattern Generation (ATPG) algorithmsAutomatic Test Pattern Generation (ATPG)…
A Framework for Parallel Random Unit Testing A Framework For Automated Parallel Random Unit Testing Of Sequential Programs by Martin Brown A Master’s Thesis Presented to…