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Journal of Microscopy, Vol. 230, Pt 3 2008, pp. 487–498 Received 20 July 2007; accepted 3 January 2008 Three-dimensional EBSD study on the relationship between triple junctions…

Documents Materials Sample Preparation for TEM Electron Transparency (thickness < 100 nm) Initial form of the....

Slide 1 Materials Sample Preparation for TEM Electron Transparency (thickness < 100 nm) Initial form of the material: particulate or bulk material Slide 2 Particulate…