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Journal of Microscopy, Vol. 230, Pt 3 2008, pp. 487–498 Received 20 July 2007; accepted 3 January 2008 Three-dimensional EBSD study on the relationship between triple junctions…

Documents Calibration of Concave 106 Ru Applicators at NIST Christopher G. Soares Ionizing Radiation Division....

Calibration of Concave 106Ru Applicators at NIST Christopher G. Soares Ionizing Radiation Division National Institute of Standards and Technology Physics Laboratory UNITED…

Documents Electron Diffraction Search and Identification Strategies.

Electron Diffraction Search and Identification Strategies Search Strategies for Electron Diffraction Historical The use of the Powder Diffraction File (PDF) for electron…

Documents Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

Principles of depthresolved Kikuchi pattern simulation for electron backscatter diffractionJournal of Microscopy, Vol. 239, Pt 1 2010, pp. 32–45 doi: 10.1111/j.1365-2818.2009.03353.x

Documents Characterization of microstructure in aluminum alloys based on electron backscatter diffraction

UntitledDer Fakultat Maschinenbau Doktor-Ingenieurs (Dr.-Ing.) 1.2.1 Production of aluminum . . . . . . . . . . . . . . . . . . . . . . . . . 5 1.2.2 Aluminum alloys . .