Slide 1April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view of boundary…
Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller…