Slide 1Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 23/19alt1 Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence) n…

Slide 1Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional test…

Slide 1 Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 16alt1 Lecture 16alt Analog Circuit Test (Alternative to Lectures 17, 18, 19 and 30)  Analog circuits…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 20/17alt1 Lecture 20 Delay Test (Lecture 17alt in the Alternative Sequence) n Delay test definition n Circuit…

Slide 1 Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 19alt1 Lecture 19alt I DDQ Testing (Alternative for Lectures 21 and 22) n Definition n Faults detected by…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view of…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 301 Lecture 30 IEEE 1149.4 JTAG Analog Test Access Port and Standard n Motivation n Bus overview n Hardware…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 9alt1 Lecture 9alt Combinational ATPG (A Shortened version of Original Lectures 9-12) n ATPG problem n Algorithms…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 11alt1 Lecture 11alt Advances in Combinational ATPG Algorithms  Branch and Bound Search  FAN – Multiple…

Slide 1 Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 14/13alt1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods (Lecture 13alt in the Alternative Sequence)…