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Education VLSI Test Technology & Reliabillity - Module 11 digital_dft_and_scan_design

1 VLSI Test Technology and Reliability (ET4076) Lecture 9(1) Digital DFT and Scan Design (Chapter 14) Said Hamdioui Computer Engineering Lab Delft University of Technology…

Documents Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG...

Slide 1Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest…

Documents April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan...

Slide 1April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view of boundary…

Documents Heuristic Optimization Athens 2004 Department of Architecture and Technology Universidad...

Slide 1 Heuristic Optimization Athens 2004 Department of Architecture and Technology Universidad Politécnica de Madrid Víctor Robles [email protected] Slide 2 Teachers…

Documents A Comprehensive Look at VLSI Fault Diagnosis David B. Lavo Dissertation Defense July 19, 2002.

Slide 1 A Comprehensive Look at VLSI Fault Diagnosis David B. Lavo Dissertation Defense July 19, 2002 Slide 2 Outline Background & Philosophy Three-Stage Fault Diagnosis…

Documents 01 Test Overview 2pp

1© K.T. Tim Cheng 01_overview, v1.0 About the Instructor z Kwang-Ting (Tim) Cheng â PhD, 1988, Univ. of California, Berkeley â 1988-1993: AT&T Bell Labs â 1993-Present:…