Slide 1 Dynamic Scan Clock Control In BIST Circuits Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal [email protected] Testing of VLSI Circuits…
Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal [email protected] DYNAMIC SCAN CLOCK CONTROL FOR TEST TIME REDUCTION MAINTAINING PEAK POWER LIMIT…