Slide 1TEST TIME OPTIMIZATION In Scan Circuits Priyadharshini S. Masters Thesis Defense Thesis Advisor: Dr. Vishwani D. Agrawal Committee Members: Dr. Adit D. Singh, Dr.…
Slide 1 Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal [email protected]…
Slide 1 Dynamic Scan Clock Control In BIST Circuits Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal [email protected] Testing of VLSI Circuits…