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Soumalya-HOY tester-University of Alberta (ECE 512)
Documents Soumalya-HOY tester-University of Alberta (ECE 512)

1. Can IC testing Go Wireless?Introduction to the HOY testerSoumalya Ghosh (1304792) University of Alberta Electrical and Computer Engineering [email protected] ECE 512…

Copyright 2001 Agrawal & BushnellHyderabad, July 27-29, 2006 (Day 1)1 Design for Testability Theory and Practice Professors Adit Singh and Vishwani Agrawal.
Documents Copyright 2001 Agrawal & BushnellHyderabad, July 27-29, 2006 (Day 1)1 Design for Testability Theory....

Slide 1 Copyright 2001 Agrawal & BushnellHyderabad, July 27-29, 2006 (Day 1)1 Design for Testability Theory and Practice Professors Adit Singh and Vishwani Agrawal Electrical…

Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Fault Simulation Vishwani D. Agrawal James J.
Documents Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring....

Slide 1 Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Fault Simulation Vishwani D. Agrawal James J. Danaher Professor…

EE 501 Analog IC Design Instructor Contact Information –Name: Degang Chen –Office: 2134 Coover Hall –Email: djchen@iastate.edu –Phone: 294-6277 –Office.
Documents EE 501 Analog IC Design Instructor Contact Information –Name: Degang Chen –Office: 2134 Coover.....

Slide 1 EE 501 Analog IC Design Instructor Contact Information –Name: Degang Chen –Office: 2134 Coover Hall –Email: [email protected] –Phone: 294-6277 –Office…

A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu.
Documents A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A”....

A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty…

Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty Vikram Iyengar
Documents Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty Vikram Iyengar

A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty…

Design for Testability Theory and Practice
Documents Design for Testability Theory and Practice

Design for Testability Theory and Practice Professors Adit Singh and Vishwani Agrawal Electrical and Computer Engineering Auburn University, Auburn, AL 36849, USA Hyderabad,…

Finding Best Voltage and Frequency to Shorten Power Constrained Test Time
Documents Finding Best Voltage and Frequency to Shorten Power Constrained Test Time

Finding Best Voltage and Frequency to Shorten Power Constrained Test Time Praveen Venkataramani Suraj Sindia Vishwani D. Agrawal Finding Best Voltage and Frequency to Shorten…

Power Problems in VLSI Circuit Testing Keynote Talk
Documents Power Problems in VLSI Circuit Testing Keynote Talk

PowerPoint Presentation Power Problems in VLSI Circuit Testing Keynote Talk Vishwani D. Agrawal James J. Danaher Professor Electrical and Computer Engineering Auburn University,…

Pre-Computed Asynchronous Scan Invited Talk
Documents Pre-Computed Asynchronous Scan Invited Talk

PowerPoint Presentation Pre-Computed Asynchronous Scan Invited Talk Vishwani D. Agrawal James J. Danaher Professor Electrical and Computer Engineering Auburn University,…

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