Documents A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A”....

A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty…

Documents Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty Vikram Iyengar

A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty…