Slide 1 Materials Sample Preparation for TEM Electron Transparency (thickness < 100 nm) Initial form of the material: particulate or bulk material Slide 2 Particulate…
TEM specimen preparation techniques D. V. Sridhara Rao 1 , K. Muraleedharan 1 and C. J. Humphreys 2 1 Electron Microscopy Group, Defence Metallurgical Research Laboratory,…
Dual Beam FIB/FESEM at Missouri S&T Frank S. Miller, Missouri University of Science and Technology, DMR 0723128. Diamond-like Carbon on Tungsten Carbide - PowerPoint…