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1. This page intentionally left blank 2. A Designer’s Guide to Asynchronous VLSI Create low power, higher performance circuits with shorter design times using this practical…

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller…

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Mini-SRAM Test Structures: Distributed SRAM Yield Micro Probes for Monitoring 3D Integrated Chips JB Kuang and Keith Jenkins IBM Research June 2013 2013 © IBM Corporation…