Documents JB Kuang and Keith Jenkins IBM Research June 2013

Mini-SRAM Test Structures: Distributed SRAM Yield Micro Probes for Monitoring 3D Integrated Chips JB Kuang and Keith Jenkins IBM Research June 2013 2013 © IBM Corporation…

Documents Mini-SRAM Test Structures: Distributed SRAM Yield Micro Probes for Monitoring 3D Integrated Chips JB...

Mini-SRAM Test Structures: Distributed SRAM Yield Micro Probes for Monitoring 3D Integrated Chips JB Kuang and Keith Jenkins IBM Research June 2013 2013 © IBM Corporation…