Q uality R eliability T echnology QRT Inc. Professional company in reliability test and failure analysis
Quality Reliability Technology
QRT Inc.
Professional company in reliability test and failure analysis
www.qrtkr.com 3
Create success to customers with technology and devotion
our future with challenge and innovation.
VISION
Exciting
Experts with long experiences and abundant know-hows will support your company in production innovation and im-provement of product quality and reliability.
Operating Life & Environmental Reliability Test
Physical & Mechanical Test
Electrical Stress Test
FIB(Focused Ion Beam)Solution
Material Analysis
Training & Consulting
ESD · EMI · EOS
Physical Test / Vibration, Shock, Tensile Shear and Fracture
FIB Service Circuit Repair Precision Analysisa
Micro Structure Analysis, Surface Analysis, Organic/Inorganic Analysis
The reliability test provides various life/environmental evaluation test services such as the temperature, humidity and bias(THB) test, which evaluates endurance in an environment of high temperature and humidity, and thermal shock test in-cluding the high temperature operating life(HTOL) test, high temperature/low temperature storage test(HTSL/LTSL), which evaluates the operating life in its user environment after completing product development.
The environmental test is one to accelerate user environments such as temperature and humidity, but the physical test is an area to apply physical stresses such as bending a product or dropping it to the � oor. Evaluation services are provided such as the shock test and vibration test which evaluates physical characteristics (tensile force, shearing force) of products or simulates physical stresses produced in a manufacturing process and user environment, particularly portable devices or automotive environment.
The endurance is evaluated against electrical stress such as static electricity and overvoltage at the semiconductor compo-nent, module and set levels, and the EMC conformity assessment service is provided for automotive semiconductor.
The micro circuit repair is provided with the accumulated technological know-how and the latest equipment so that can reduce the cost and period required for R&D and veri� cation of characteristics.
Provides a structure & chemical analysis solution for materials that are used in products such as semiconductors, polymers and electronic components, using various analysis equipment and newest analysis tools.
Failure Analysis Destructive/Nondestructive Physical Property Analysis Specimen Pretreatment
The analysis technology which has been accumulated for the defective occurred in the R&D, manufacturing process and user environments, and new analysis tools are used to provide the failure analysis service to � nd a root cause of the failure.
CEO Message Business Part
CEO of QRT Inc.
Kim, Young-boo
Dear customer, How do you do?I am Kim, Young-boo, CEO of QRT Inc.Over the past few decades, the world electronics industry has grown very rapidly, par-ticularly technology in the semiconductor fi eld which is more widely applied for every new product.In spite of this remarkable growth and development, the reliability evaluation and fail-ure analysis technology service fi eld, which is needed for securing quality of various components and parts including semiconductor, is so inadequate that many compa-nies are currently experiencing a number of diffi culties in several stages of business such as reliability evaluation of new products, mass production quality assurance and responding to customer claims.Accordingly, our QRT Inc. has contributed to the reliability improvement and quality advancement of every industry related to electronic components including domestic and foreign mobile, display, automotive electric components and eco-friendly market on the basis of the quality evaluation technology and professional technology man-power which has been developed as a core specialized fi eld for over 30 years in SK Hynix Semiconductor, the country’s representative enterprise.So far, QRT Inc. has provided the reliability evaluation and failure analysis services to a lot of customers with cutting-edge technology and equipment, fast service, and these eff orts have led to realizing customer satisfaction and opportunities for our company
also to grow along with, so we heartily thank our customers, and these all results can be achieved by our customers’ constant interest and support.We are building the diversifi ed foundation of growth to jump up to be a valuable company giving greater satisfaction consist-ently also in the future, and trying to be a companion who can create a greater impression to customers by strengthening activities such as investing in new technology development and equipment, effi cient management of organization, procuring and cultivating outstanding talented personnel.We, QRT Inc., will do always our best to achieve mutual progress through customers’ development and business success with the world’s highest quality and competitive service as an everlasting partner of our customers now and for ever.Our customers are at the center of QRT Inc.A better future we will make based on our management philosophy of creating a community, with all our hearts, to pleasantly work with customers will be always with our customers.Please keep an eye with encouragement and support on QRT Inc. making constant eff orts to jump up to a new look.Thank you.
Reliability Test / Life & Environmental Test
Quality Reliability Technology www.qrtkr.com4 5
X-Ray Analysis
Scanning Acoustic Analysis(SAT/SAM)
Electrical Characteristic Analysis (Curve Tracing)
Decapsulation(Decap)
Chip Delayering
Cross Section
Examination of delamination and crack in IC
Preparation such as IC inside and PCB cross section processing
Micro circuit edit of IC
TEM sample preparation
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· Production and Process Management
· Quality Guarantee and Reliability Establishment
· Certi� cation and Diagnosis of Quality Management System
· Internal Audit/Leadership/Coaching
Scanning Electron Microscope(SEM)
Energy Dispersion Spectroscope(EDS)
EMMl(PHEMOS/THEMOS)
Dye & Pry
External Inspection (Optical Scope)
IC Counterfeit Analysis
Scanning Electron Microscopy(FE-SEM)
Dual Focused Ion Beam (Dual FIB)
Transmission Electron Microscope(TEM)
Energy Dispersion Spectroscope(EDS)
Electron Energy Loss Spectroscope(EELS)
Atomic Force Microscope(AFM)
Secondary Ion Mass Spectrometer(TOF-SIMS)
Auger Electron Microscope(AES)
X-Ray Photoelectron Spectroscopy(XPS)
X-Ray Di� raction(XRD)
Gas Chromatography(GC)
Gas Chromatography-Mass Spectrometry(GC-MS)
Fourier Transform Infrared Spectroscopy(FT-IR)
Ultraviolet Visible Spectroscopy(UV/VIS)
Inductively Coupled Plasma Optical Emission Spectroscopy(ICP-OES)
Inductively Coupled Plasma Mass Spectrometry(ICP-MS)
X-Ray Fluorescence Spectrometry(XRF)
Ion Chromatography(IC)
�M�e�t�a�l� �C�u�t�/�D�e�p�o�s�i�t�i�o�n
�I�n�s�u�l�a�t�i�o�n� �C�u�t�/�D�e�p�o�s�i�t�i�o�n
Training
Consulting
Factory Audit
Non-destructive Analysis
Destructive Analysis
Sample Preparation
Micro Structure Analysis
Surface Analysis
Organic Analysis
Inorganic Analysis
Failure Analysis
Service Items For respective test/analysis items, it can be carried out a standard test such as JEDEC/MIL/AEC/KS and customized test. Please refer to our homepage for further details.(Scan QR Code)
Category Category
Reliability Test
Integrated Analysis
FIB Analysis
Material Analysis
Training & Consulting
Physical & Mechanical
Test
Life Test
Vibration/Combined Environment
Early Life Failure Rate Test(ELFR)
High Temperature Operating Life Test(HTOL)
Low Temperature Operating Life Test(LTOL)
High Temperature Gate Bias Test(HTGB)
High Temperature Forward Bias Test(HTFB)
High Temperature Reverse Bias Test(HTRB)
Non-volatile memory(Flash) Reliability Test
Vibration Test(VIB)
Combined Environmental Reliability Test(CERT)
High Accelerated Life Test(HALT)
Mechanical Shock Test(MS)
Package/Box Drop Test(Drop)
Veri� cation of durability and forecast of life time through operating and environ-mental acceleration tests, considering user environment
●� Applicable Standards�
- International Standard for IEC, ISO, etc
- Product Standard for JEDEC, AEC, MIL-STD, etc
- OEM Requirements for automotive such as ES, GM, etc
Veri� cation of durability in regard to vibra-tion, complex environment(temperature, humidity & vibration) and shock(drop)
●� Applicable Standards�
- International Standard for IEC, ISO, etc
- Product Standard for JEDEC, AEC, MIL-STD, etc
- OEM Requirements for automotive such as ES, GM, etc
Reproducing Tensile/Shear/Compression Stress using the newest UTM system
●� Objects for Application�
- Die, Wire Bonding, etc.
- PKG Body, Lead, Solder Ball, etc.
- PCB, Module, etc.
Veri� cation of compatibility for various electrical stress(from IC to end products of system)
●� Applicable Standards�
- International Standard for IEC, ISO, etc.
- Product Standard for JEDEC, AEC, MIL-STD, etc
- OEM Requirements for automotive such as ES, GM, etc
Veri� cation of reliability and characteristics ofsolder joint of elements and boards
●� Applicable Standards�
- IPC, JEDEC
Moisture Sensitivity Classi� cation(MSL)
Preconditioning Test
High/Low Temperature Storage Test(HTSL/LTSL)
Temperature Humidity Bias Test(THB)
Temperature Humidity Storage Test(THS)
Temperature Cycle Test (TC)
Power Temperature Cycle Test(PTC)
Liquid Thermal Shock Test(Liquid TS)
Highly Accelerated Stress Test(HAST/uHAST)
Pressure Cooker Test(PCT)
Board Level Drop/Bending/Temperature Cycle/Vibration
Tensile/Shear
Torque/Twist/Bending
Solderability/Resistance to Solder Heat (SD/RSH)
Environment Test
Shock/Drop
Board Level
Tensile/Shear,Solder, etc.
Subcategory SubcategoryRemarks Remarks
ESD/EOS/IC-EMI
IC ESD Test(HBM/MM/CDM)
Latch-up
System Level Gun ESD Test(Gun-ESD)
Electrical Overstress Test(EOS)
IC Level EMI Test(IC-EMI)
Electrical Load Test for Automotive Application
Electrical Stress Test
Quality Reliability Technology www.qrtkr.com6 7
AEC-Q100Integrated Circuits
AEC-Q101Discrete Semiconductors
AEC-Q200Passive Components
Evaluation of Lead-free Solder Applied Electrical
Components
JEDEC, AEC-Q100,101,200, OEM in-house spec.
AEC-Q101Discrete Semiconductors
AEC-Q200Passive Components
OEM Components Qualification SpecificationES95400 / ES95910 / ES90000 Series and etc
AEC-Q100Integrated Circuits
Component LevelQualification
Automotive LevelMechanical Durability
Sub. System LevelQualification
Driver informationDashboard displayCar navigation
ChassisPower steeringBrakingVDM
Body electricalsIBCMCAN gatewayLight controls
SecurityImmobilizerCar alarm
PowertrainEngine control systemTransmissionFuel injectionFuel pump
SafetyAirbagsSeat occupation detectionPedestrian protectionNight visionTire air pressure detection
Ultracapacitors
Hydtogen tanks
Electric motor
Power Control Unit
Fuel cell system box
Fuel cell stack
Powertrain radiator
Fuel cell systemradiator
Quali� cation Requirements for High Quality and Reliability of Automotive Electronic Components
Quality Certi� cation for Automotive Electronic Components
Main Automotive application components
Composition of main Automotive application components
Automotive Electronics Quali� cation
Certi� cations, AEC Standards & OEM Speci� cation Required for Automotive Electrical Components
Quality Reliability Technology www.qrtkr.com8 9
AEC-Q100, the reliability evaluation standard for integrated circuit(IC), de�nes 4 classes in regard to available temperature range. It is composed of various reliability tests that target not only information on design and production but also core failure mechanism. It is a suitable standard for automotive semiconductor evaluation that requires high reliability.
AEC-Q101 is the standard for evaluating discrete components that consist of only one component,such as FET, Diode, IGBT, and Transistor. It consists of tests that can evaluate the physical durability and characteristics of high heat power semiconductors or optical semiconductors
AEC Q100 AEC Q101
Qualification Test Definitions for Discrete Semiconductors
Qualification Test Flow for Integrated Circuits
Fault Detection Test
Reliability Test Electrical Characteristic Test
Life Test Mechanical Test
Suitability Test for Package
Process FAB ProcessReliability
Test Electrical Characteristic Test
-40℃ to +125℃ discrete semiconductors except for LEDs
-40℃ to +85℃ all LEDs
Grade 0 -40℃ to +150℃
Grade 1 -40℃ to +125℃
Grade 2 -40℃ to +105℃
Grade 3 -40℃ to +85℃
Stress Abrv Datatype Note
SampleSize
per lot
# oflots
Accepton #
failed
Reference(currentrevision)
1
Pre- and Post-Stress Electrical
Test
TEST 1 NGparts tested per therequirements of the
appropriate part0
User
supplier’sstandard
Test is performed as specifi ed in the applicable stress reference at room temperature.
2 Pre- PC 1 GS parts before Test # 7,8, 9, & 10.
0 JESD22A-113
Performed on surface mount parts (SMDs) prior to Test #
Any replacement of parts must be reported.
3 External Visual EV 1 NG parts 0 JESD22
B-101 marking and workmanship.
4 Parametric PV 1 N 25 3Note A 0 Individual AEC over the part temperature range to insure
5High
TemperatureReverse Bias
HTRB 1 CDGKUVPX 77 3
Note B 0 MIL-STD-750-1M1038 Method A
1000 hours at the maximum DC Reverse Voltage rated
The ambient temperature TA is to be adjusted
HTRB as a minimum. (See note X HTRB.)To be implemented on, or before, April 1, 2014.
27 Dielectric Integrity DI 3 DM 5 1 0 AEC-Q101-004
Pre- & Post-process change comparison to evaluate process change robustness.All parts must exceed gate breakdown voltage minimum (Power MOS & IGBT only).
28
Short CircuitReliability
Characteriza- SCR 3 DP 10 3Note B 0 AEC-Q101-006 For smart power parts only.
29 Lead Free LF 3 - - - AEC-Q005For all related solderability, solder heat resistance and whisker requirements.To be implemented on, or before, April 1, 2014.
Design Production
Reliability Test
Transistor
LED
Automotive Electronics Quali� cation
Grade Level Ambient Operating Temp. Range Minimum Temp. Range
QUALIFICATION TEST DEFINITIONS
Discrete Semiconductor Type
Quality Reliability Technology www.qrtkr.com10 11
0 -50℃ to +150℃ Flat chip ceramic Resistors, X8R ceramic capacitors
1 -40℃ to +125℃Capacitor Networks, Resistors, Inductors, Transformers, Thermistors, Resonators, Crystals and Varistors, all other ceramic and tantalum capacitors
2 -40℃ to +105℃
3 -40℃ to +85℃Film capacitors, Ferrites, R/R-C Networks and Trimmer capacitors
Stress NO. Note Sample Size Per Lot
Numberof lots
Accept onNumber
failedPre-and Post-StressElectrical Test 1 G 0
High TemperatureExposure 3 DG 77
Note B 1 0
Temperature Cycling 4 DG 77Note B 1 0
Analysis 5 DG 77Note B 1 0
Shear Strength 31 DG 30 1 0
Short Circuit FaultCurrent Durability 32 DG 30 1 0
Fault Current Durability 33 DG 30 1 0
End-of-Life Mode 34 DG 30 1 0
Jump Start Endurance 35 DG 30 1 0
Load Dump Endurance 36 DG 30 1 0
Inductor
Resistor
Capacitor
QRT Inc. AEC Standard Full Coverage Service
Qualification Test Definitions for Passive Components
AEC Q200 AEC-Q200 is the evaluation standard for passive elements such as Capacitor, Inductor, and Resistor. The minimum temperature range that is required for each product is provided in the table below, and this consists of tests that take into account the characteristics of passive elements such as �ammability and lead integrity The certi�cation test demands that follow AEC standards are increasing as the demand for high-reliability semiconductors are
mounting. However, it was not easy to �nd a laboratory at home and abroad that provides all the tests de�ned in each standard. QRT Inc. has been putting e�orts into constructing the requirements of the AEC standard, and is now providing Full Coverage Quali�cation Services for customer satisfaction.
QRT Inc. can execute tests in regard to the conditions of each class required for automobile electronic components, and we also have a system to evaluate environment tests, life tests, electrical characteristics and mechanical characteristics for reliability evaluation that satis�es the AEC-Q Standard. Furthermore, we can give a quick feedback since we are running a failure analysis lab that can instantly analyze the occurred failure. In regard to the AEC Inc Test, the person in charge provides a 1-on-1 One Stop Service to minimize customer inconvenience and increase e�ciency of the work procedure.
Automotive Electronics Quali� cation
Grade Temp. Range Passive Component Type
QUALIFICATION SAMPLE SIZE REQUIREMENTS
Quality Reliability Technology www.qrtkr.com12 13
Semiconductor & Electronic Component
Smart Appliance
Smartphone
Internet of Things (IOT)
Smart Medical System
Wearable Device
Aerospace/Defense
The electronic system for Automotives is gradually turning into smart electronic equipment, from equipment that pas-sively assists driving or driver’s condition to equipment that predicts the situation and controls the system with the goal of achieving a complete automated driving system. Following this trend, the regulations of ISO 26262 de� ne systematic safety requirements to minimize physical damage due to failure in electronic devices. Since functional stability can be es-tablished with component reliability as the foundation, the OEM standards for certi� cation and evaluation of components is getting reinforced.
The test that is demanded in the ES standard requires conducting sequential tests and the use of special/large equipment. Thus, it is important whether laboratory capacity and the equipment can be provided all at once. In addition, with the 24/7/365 operating system as the foundation, functional tests can be provided and custom sequence operation is pos-sible at any time that the consumer prefers, be it before, during, or after the test.
ES90000-01 ‘Inspection of Solder Joint’
ES90000-04 ‘Reliability Tests for Pb-free Soldering’
ES90000-02 ‘Delamination Inspection for Mounted Part’
ES90000-03 ‘Reliability Test for bare PCB’
ES90000-05 ‘Highly Accelerated Life Test’
ES95400-10 ‘Environmental Tests for Electronic Equipment’ES95910-93 ‘Environmental Tests for Air Bag System’
Required Automotive environmental test/audit standard for the classi� cations and parts electronic components
Provides ES standards for Hyundai Motors
Quality Evaluation of the environmental durability of Automotive Module
Reliability Test Service in the Key ICT Fields
Quality Reliability Technology www.qrtkr.com14 15
One-Stop Integrated Analysis Service
Failure Analysis Service
Material Analysis Service
■ Analysis of material microstructure and fine cross section of micro area
■ Component analysis of material surface, distribution chart and survey depth profiling
■ Qualitative and quantitative analysis of inorganic compounds
■ Qualitative and quantitative analysis of organic compounds
LED Quantum Well Stucture_TEM Nano Cellulose_FE-SEM Bump Grain Orientation_Dual FIB
Micro Structure Analysis
Organic Analysis
▶ FE-SEM Analysis▶ Dual FIB Analysis▶ TEM Analysis▶ EDS Analysis▶ EELS Analysis
▶ GC Analysis▶ GC-MS Analysis▶ FT-IR Analysis▶ UV/VIS Analysis
▶ AFM Analysis▶ TOF-SIMS Analysis▶ AES Analysis▶ XPS Analysis▶ XRD Analysis
▶ ICP-OES Analysis▶ ICP-MS Analysis▶ XRF Analysis▶ IC Analysis
Surface Analysis
Inorganic Analysis
SMT / PCB Analysis
PCB Module
Material Analysis
Manufacturing Process
FIB Circuit Edit
Design
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ompo
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Ana
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Com
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Solderability Test
Assembly Process
FAILURE ANALYSISSERVICE
Integrated Analysis Service
Quality Reliability Technology www.qrtkr.com16 17
■ Training
Provides comprehensive and essential core programs that includes not only basic theories to improve the reliability and quality of the product, but also on-site training(training process open for negotiation)
•Production and Process Management�
•Management of Factory Static and ‘3Jung’
•Productivity Improvement and Cost Control
•Management/Analysis of Factory Yield
•Quality Control system(6 sigma/TPM/SPC etc.)
•Quality Guarantee and Reliability Evaluation system
•� � Certification and Diagnosis of Quality Manage-ment System(ISO 9000/9001, KOLAS, ISO 26262 etc.)
•Planning and Management of Business
•Internal Audit / Leadership / Coaching
•� � Equipment Management System (preventive main-tenance system etc.)
•� � Development of system(equipment) for special evaluation or objectives
■ Application Period� � � � By the end of December of the year the business started(early deadline when the budget is exhausted)
■ Application method�-� During business period, regular online application available at www.smtech.go.kr �-� Apply by writing equipment utilization plan and application form at www.smtech.go.kr �-� � � The participating � rm that has once been approved can continue to participate in the business until the end
date (end of December of the year) unless additional restrictions are imposed
■ People in chargeSenior Researcher Lee, Seonghun : +82-31-8094-8253 [email protected]
Researcher Ahn, Minkue : +82-31-8094-8251 [email protected]
■ Consulting
Provides guidelines for the innovation of product production process and quality improvement
■ Factory Audit
Helps for a clear understanding of the suppliers’ production capacity, quality control system, and manage-ment and operation procedures
Main categories
Training and Consulting National Support Project
Training, Consulting and Factory Audit Business to support Co-utilization of Research Equipment Audit
Business classi� cation Government subsidy Expense share for company Total Voucher
Startup companies(companies under 7 years)
Under 70%(Max. 70million Won)
Over 30%(Cash)
100%
General companies(companies over 7 years)
Under 60%(Max. 70million Won)
Over 40% (Cash)
100%Provides comprehensive and essential core programs that includes not only basic theories to improve the
Money
Time
Quality
Reduce Costs, Improve ProductivitySecurement of Quality and Reliability
■ Business PurposeEstablish the foundation for boosting the utilization of the equipment in institutions and improving the technology com-petitiveness of small and medium-sized businesses, by supporting co-utilization of the research equipment and software that universities and research institutions possess in the research & development of the small and medium-sized � rms www.smtech.go.kr (comprehensive management system) ▶ refer to business announcement for details
■ Target for SupportSmall and medium-sized businesses that plan on conducting research & development
■ Support RangeSupports equipment fees in the form of online vouchers(coupon) to small and medium-sized businesses, that use re-search equipment that universities and research institutions possess for research & development purposes (the upper bound for government subsidies has been increased in 2016)
�P�a�r�t�i�c�i�p�a�t�i�n�g� �f�i�r�m�s� � Information system on the status of small and medium-sized businesses� ▶� Identifying small and medium-sized businesses Guide to identifying the range of my small and medium-sized business
� �*� � � Only for certi� cation of new technology development such as NET(new technology), NEP(new product), new environmental technology, new construction technology
�*� For further details on this business, please contact the people in charge listed below
■ Standard for issuing test reportPermitted R&D results, for management of quality, for analysis of factors for failure, for certi� cation
(only for certi� cation of new technology)
unacceptable delivery, for certi� cation
National Support ProjectNational Support ProjectNational Support ProjectNational Support Project
i.e if a general company purchases 10 million Won worth of vouchers ▶ 6 million Won(60%/government subsidy) + 4milion Won(40%/expense share for company)
Quality Reliability Technology www.qrtkr.com18 19
Reliability Test Service (AEC/JEDEC/OEM Speci� cation)
Analysis Service
Essential Certi� cation status and Support Business
Service Procedure / Accreditation Location & Contact Point
QRT Inc. had acquired the country’s � rst KOLAS international certi� ed testing institution quali� cation for industrial and automo-tive semiconductor � elds in 2004 and 2009, respectively. Because the products, which had passed test in QRT Inc. don’t need to undergo an extra additional test by mutual recognition for domestic and overseas sales, the cost of testing can be reduced and the development period can be shortened.
QRT Inc. is selected as a lead agency of the research equipment co-utilization support project, so small and medium-sized busi-nesses can be supported by 60~70% from the Small and Medium Business Administration when using our company’s equipment and service for the R&D purpose (see www.smtech.go.kr).
QRT Inc. acquired the Certi� ed IPC Specialist (IPC o� cially recognized engineer) quali� cation for IPC-A-610 (Acceptability of Electronics Assemblies) and IPC-A-600 (Acceptability of Printed Boards) of IPC (Institute for Printed Circuits), so contributes to improving quality/reliability in the ICT electronics industry.
Global Network
Main Task Person in Charge Contact E-mail
Semiconductor Test & AnalysisJeong, Hanchul� +82-31-8094-8212 [email protected]
Lee, Jinsu� +82-31-8094-8214 [email protected]
Automotive Application Component Test & Analysis
Kang, Jeonghoon +82-31-8094-8213 [email protected]
Lee, Hyunbae +82-31-8094-8256 [email protected]
Vibration / Mechanical Test Jung, Sukhwan� +82-31-8094-8228 [email protected]
Consulting/Technical Training Kim, Namho +82-31-8094-8221 [email protected]
Failure Analysis (Gwanggyo Open Lab) Kim, Hyunsoo
FIB Analysis (Gwanggyo Open Lab)� Kim, Chulsoo +82-31-546-7544 [email protected]
Material Analysis (Gwanggyo Open Lab)
ESD/EOS/EMI (Gwanggyo Open Lab) Kim, Dongseong� +82-31-546-7549 [email protected]
Customer and Technology Support
Contact Information of main people in charge
To cover the whole spectrum of the electronics industry from IC to end Products.
KOREA
CHINA-WUXI
JAPAN-TOKYO
USA-SAN JOSE
Construction of nationwide service network Securement of nationwide service infrastructure through construction of laboratory in key bases in Korea
Gwanggyo
Cheongju
Gumi
Icheon(Headquarters)
Sales Net-work
+82-31-546-7546 [email protected]
Product Information Receive Test Request Issuing Estimates
Accept Purchase Order (PO)
3~4 weeks are required for producing the board
Review of Test Board Manufacturing
Progress Manufacturing of Board
Test Board Receipt/Acceptance
Progress Reliability Test
Package Information
Consultation about Board Manufacturing Condition
Datasheet/Pin Layout Test ItemReview of Conditions
HTOLLTOL THB ESDTest Vector
Operation TimingOperating Voltage
Bias Con� gurationBiasing Voltage
Zapping VoltageZapping ModeZapping Pin/Group
HTOL:
T H B :
E S D :
Pin count / Dimension
Client RemarksQRT Inc.
Check the requested items Accept the request and specimen
Review of analysis information
Sending the analysis result
Sending the estimate
Issuing the tax invoice
Carrying out the analysis
Preparing the request and sending specimens
Review of Analysis Results
Troubleshooting
Client QRT Inc.
Telephone Enquiry +82-31-8094-8211
A Global Leading-edge Company
for Reilablity Engineering and Failure Analysis