January 1, 2002/ARR 1 1. “Overlap” Design Regions for IFE Dry Wall 2. Scoping Analysis of Condensation for Wetted Wall A. R. Raffray, D. Blair, J. Pulsifer, M. S. Tillack, X. Wang University of California, San Diego ARIES-IFE Meeting UCSD January 10-11, 2002
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January 1, 2002/ARR 1 1. “Overlap” Design Regions for IFE Dry Wall 2. Scoping Analysis of Condensation for Wetted Wall A. R. Raffray, D. Blair, J. Pulsifer,
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January 1, 2002/ARR1
1. “Overlap” Design Regions for IFE Dry Wall 2. Scoping Analysis of Condensation for Wetted Wall
A. R. Raffray, D. Blair, J. Pulsifer, M. S. Tillack, X. Wang
University of California, San Diego
ARIES-IFE Meeting
UCSD
January 10-11, 2002
January 1, 2002/ARR2
Overlap Design Regions for IFE Dry Wall
Simple self consistent calculation• Driver/target parameters• Chamber geometry and chamber wall design • Power to chamber wall• Coolant outlet temperature• Cycle efficiency• Thermal-hydraulic parameters• Maximum temperature of chamber wall
- Chamber wall power assumed to be spread over the complete period between successive shots (optimistic assumption)
• Run a few example cases with the goal of maintaining SiCf/SiC Tmax at the wall < 1000°C
- Results will show acceptable combination of parameters (design window)
January 1, 2002/ARR3
Simple Estimate of Maximum W and SiCf/SiC Temperature Under IFE Energy Deposition for 2 Direct-Drive and 2 Indirect-
Drive Driver/Target Cases
Chamber Wall Coolant Inlet
EnergyFront
Assume Channel L = R
4-mm SiCf/SiCWall
Chamber Wall Coolant Outlet
5-mm Cooling Channel
Max. SiCf/SiCTemp.
1-mm W Armor
Direct Drive LY:Driver Energy = 1.2 MJGain = 128Yield = 153.6 MJDriver Efficiency = 0.07
Direct Drive LY:Driver Energy = 1.2 MJGain = 128Yield = 153.6 MJDriver Efficiency = 0.07
Example trade-off - What is preferable?• a small size chamber with low rep rate and electric power or the opposite (not clear)• a small size chamber with lower cycle efficiency and electric power or the opposite
Example trade-off - What is preferable?• a small size chamber with low rep rate and electric power or the opposite (not clear)• a small size chamber with lower cycle efficiency and electric power or the opposite
Gain 128 138 139 63Target yield (MJ) 154 400 458 378Spectra From J.
Perkins’ calc.From J.Perkins’ calc.
From J.Perkins’ calc.
N/A
Photon energy (MJ) 2.14 6.07 115Burn product fast ion energy (MJ) 18.1 52.2 8.43Slow ion energy (MJ) 24.9 60.0 18.1Neutron energy (MJ) 109 279 316Gamma energy (MJ) 0.0046 0.0169 0.36Injection velocity (m/s) 400 400 100Initial temperature (K) 18 18 18Calculated D-T temperature rise(K)
≤1.8 ≤1.8 <<1
ChamberChamber radius (m) 7.3 7.2 6.9 6.9Protective gas Xe Xe XeGas density (mTorr) 10 10 (D. Haynes) (D. Haynes)Number of penetrations 100 100 (W. Meier) (W. Meier)Size of penetrations @ FW (m) 0.1 0.1 (W. Meier) (W. Meier)Conductance (liter/s) 36,420 36,420 (J. Pulsifer) (J. Pulsifer)Continuous pumping flow rate(mbar-liter/s)
Coolant pressure drop (MPa) ~1 ~1 ~1 ~1Maximum armor temperature (°C) (D. Haynes) (D. Haynes) (D. Haynes) (D. Haynes)Armor evaporation per shot (μm) (D. Hayne)s (D. Hayne)s (D. Hayne)s (D. Hayne)sArmo r evaporati on pe r ye (ar μm) (D. Hayne)s (D. Hayne)s (D. Hayne)s (D. Hayne)s
Blanket ARIE -S AT ARIE -S AT ARIE -S AT ARIE -S ATStructur almaterial SiCf/SiC SiCf/SiC SiCf/SiC SiCf/SiCBreeder Pb-17Li Pb-17Li Pb-17Li Pb-17LiTot althicknes (s m) 0.4 0.4 0.4 0.46L i enrichmen (%)t 90 90 90 90Coola nt( inserie swi thFW) Pb-17Li Pb-17Li Pb-17Li Pb-17LiCoola nt inl et pressur e(MPa) ~0.7 ~0.7 ~0.8 ~0.8Coola nt inl ettemperatu (re °C) 715 715 725 725Coola nt outl ettemperatu (re °C) 1100°C 1100°C 1100°C 1100°CCoola nt pumpi ng pow (er M )W ~ 5 MW ~ 5 MW ~ 4 MW ~ 4 MW
January 1, 2002/ARR8
Example Strawman Parameters(as of Jan 10, 2002)
DD Target(LY)
DD Target(HY)
ID Target 1 ID Target 2
NeutronicsNeutron wall loading (MW/m2) 2.3 2.3 5.8 5.8Tritium breeding ratio 1.1 1.1 1.1 1.1Nuclear energy multiplicationOverall energy multiplication
1.11.078
1.11.078
1.11.076
1.11.076
Volumetric Heat Generation inFW (MW/m3) 1 mm W armor 0.5 cm SiC/SiC 0.5 cm Pb-17Li 0.5 cm SiC/SiC
229.815.59.4
229.815.59.4
57253823
57253823
PowerFusion power (MW) 2181 2121 1847 1852Total thermal power (MW) 2335 2271 1961 1980First wall power from neutron(MW)
128 120 105 105
Total first wall power (MW) 761 739 673 680Blanket power (MW) 1398 1360 1143 ~1150Blanket/shield power (MW) 1575 1532 1288 1301Power Cycle Brayton Brayton Brayton BraytonCycle efficiency (%) 55.7 55.7 55.7 55.7Auxiliary Power (MW) 52 51 44 44Driver Power (MW) 243 220 53 63Gross Electric Power (MW) 1300 1264 1092 1102Net Electric Power (MW) 1005 995 996 996
January 1, 2002/ARR9
Major Issues for Wetted Wall Chambers
• Wall protection
- several processes involved
- photon/ion penetration depth for energy deposition
- evaporation
- armor film re-establishment
- recondensation
- fresh injection
- supply method (method, location)
- coverage
- hot spots, film flow instability, geometry effects
• Chamber clearing- target, driver and pumping requirements
- vapor pressure and temperature
- aerosol concentration and size
- condensation trap in pumping line
Drop condensation
Film condensation
January 1, 2002/ARR10
Condensation Scoping Analysis
• Initial analysis used RECON - example results previously shown- several processes involved
- difficult to fully understand individual effects and influences
• Seems wise to first focus on the fundamentals of condensation for better understanding and then plan accordingly for an integrated analysis- film condensation equation based on kinetic theory
- droplet condensation equations based on droplet/environment equilibrium and nucleation theory
• Assess effect on condensation rate and characteristic time to clear chamber of various parameters, including:
- chamber vapor conditions
- film temperature
- velocity of vapor
- presence of non-condensable gas
January 1, 2002/ARR11
Fundamental Film Condensation Equation Based on Kinetic Theory
jnet = net condensation flux (kg/m2-s)
M = molecular weight (kg/kmol)
R = Universal gas constant (J/kml-K)
= correction factor for vapor velocity towards film
c e condensation and evaporation coefficients
Pg, Tg = vapor pressure (Pa) and temperature (K)
Pf, Tf = saturation pressure (Pa) and temperature (K) of film
Example Scoping Calculations Assume:• Indirect-Drive Target
• Evaporated thickness and vapor temperature rise from photon and debris ion energy- Ephotons =115 MJ
- Edebris = 18 MJ
- Efast ions = 8 MJ
• Liquid Pb as film material
• Chamber radius = 5 m
jcond
jevap
TfPg
Tg
jnet=MR2π
⎛ ⎝ ⎜ ⎞
⎠ ⎟
0.5Γσc
Pg
Tg0.5
−σePf
T f0.5
⎡
⎣
⎢ ⎢
⎤
⎦
⎥ ⎥
January 1, 2002/ARR12
Condensation Flux and Characteristic Time to Clear Chamber as a Function of Pb Vapor and Film Conditions
- Characteristic time to clear chamber, tchar, based on condensation rates and Pb inventory for given conditions
- For higher Pvap (>10 Pa for assumed conditions), tchar is independent of Pvap
- For lower Pvap as condensation slows down, tchar increases substantially
0.0
1.0
2.0
3.0
4.0
5.0
6.0
7.0
8.0
1x100 1x101 1x102 1x103 1x1043x104
Vapor Pressure (Pa)
Pb:Film temperature = 1000KFilm Psat = 1.1 Pa
Vapor velocity = 0
Vapor Temp. (K)
1200
10,000
5000
2000
ƒƒ ƒ ƒ ƒ ƒ ƒ ƒ ƒ ƒ
æ
ææ æ æ æ æ æ æ æ æ
ø
ø ø ø ø ø ø ø ø ø ø
”
” ” ” ” ” ” ” ” ” ”
0
0.02
0.04
0.06
0.08
0.1
0.12
1x100 1x101 1x102 1x103 1x104 1x105 1x106
Vapor pressure (Pa)
ƒ
æ
ø
”
Pb film temperature = 1000KFilm Psat = 1.1 Pa
Vapor velocity = 0Chamber radius = 5 m
Vapor Temp.
10,000 K
5000 K
2000 K
1200 K
January 1, 2002/ARR13
Vaporized Thickness is Dependent on Energy Deposition Depth
Based on condensation:- A short penetration depth resulting in
less vaporized mass but at higher temperature seems preferable
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
0.000
0.005
0.010
0.015
0.020
0.025
0.030
0.035
1.0x10-6 2.0x10-6 3.0x10-6 4.0x10-6 5.0x10-6
Fraction of ion energy used to vaporize Pb armor
Thickness of Vaporized Pb Layer (m)
0.35 0.7 1.0
Photon energy = 115 MJDebris ion energy = 18.1 MJChamber radius = 5 mPb film temperature = 1000 K
1.0x103
1.0x104
1.0x105
0.000
0.005
0.010
0.015
0.020
0.025
0.030
1.0x10-6 2.0x10-6 3.0x10-6 4.0x10-6 5.0x10-6
Fraction of photon+debris ion energy used to vaporize Pb armor
Pres. (Pa)
Thickness of Vaporized Pb Layer (m)
0.35 0.7 1.0
Photon energy = 115 MJDebris ion energy = 18.1 MJChamber radius = 5 mPb film temperature = 1000 K
Temp. (K)
- Softness of spectrum will determine penetration depth and vaporized
thickness- What is preferable less vapor at high
temperature or more vapor at lower temperature?
January 1, 2002/ARR14
Vapor Motion Toward Chamber Enhances Condensation Rate, as Shown by Example Case
• Pb velocity toward the chamber wall increases the condensation rate by up to about a factor of ~3.6 at sonic velocity-like levels
Dimensionless vapor velocity towards chamber wall
0
2
4
6
8
10
12
0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Photon energy = 115 MJ (assumed to vaporize Pb)Debris ion energy = 18.1 MJ (assumed to heat up Pb vapor)Vaporized Pb layer thickness = 3.7 microns
Chamber radius = 5 m
Pb film temperature = 1000K
January 1, 2002/ARR15
Vapor Condensation Rate can be Affected by Presence of Non-Condensable Gas
• When pressure of vapor is of the same order as that of non-condensable gas, overall pressure equilibrium results in local vapor and gas gradients and condensation becomes diffusion-limited
P
Pv,o
Pg,o
Pg,i
Tv,o
Tv,i
Pv,i
jcond=Kv,gρvPg,lm
(Pv,o −Pv,i)
jcond = condensation flux (kg/m2-s)
Kv,g = binary mass transfer coefficient for diffusion of vapor and gas over
diffusion length (m/s)
v = vapor density (kg/m3)
Pg,lm = log mean pressure of non-condensable gas (Pa)
Pv,o, Pv,i = vapor pressure in chamber and at interface (Pa)
January 1, 2002/ARR16
Vapor Condensation Rate and Characteristic Time as a Function of Xe Gas Pressure for Different Pb Vapor Pressure Values
• Pb condensation rate decreases with increasing concentration of non-condensable gas
• However, in the range of anticipated vapor and gas pressures, the effect seems negligible
Condensation rate of Pb vs. Xe background pressure
1.E-08
1.E-07
1.E-06
1.E-05
1.E-04
1.E-03
1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
1 10 100 1000 10000 100000
Xe partial pressure (Pa)
Pb condensation rate (kg/m
2-s)
(2 Pa Pb) (10 Pa Pb) (100 Pa Pb)
Characteristic time vs. Xe background pressure
1.E-07
1.E-06
1.E-05
1.E-04
1.E-03
1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1 10 100 1000 10000 100000
Xe partial pressure (Pa)
Characteristic time (s)
(2 Pa Pb) (10 Pa Pb) (100 Pa Pb)
Chamber size = 5 m
Film temperature = 1000 K
Approximate range
of interest
January 1, 2002/ARR17
Vapor Condensation Rate and Characteristic Time as a Function of Pb Film Temperature
• Pb condensation rate increases substantially within a short film temperature range at about the local BP.
• Can this be used as a mean of in-situ recoating very thin film or dry spots?
-3
-2
-1
0
1
2
3
4
0.010
0.015
0.020
0.025
0.030
400 500 600 700 800 900 100011001200130014001500
Pb film temperature (K)
Pb:Vapor temperature = 104KVapor P = 104 PaVapor velocity = 0Chamber radius = 5 m
Condensation flux
f,a
f,b
w
Coo
lan
t
PbSiC/SiC
Tfilm,def.
Tfilm
• If Tfilm,def. < Tfilm can deficient film formation be adequately corrected by preferential condensation?
January 1, 2002/ARR18
Can Film Thickness Non-Uniformity be Remedied by Condensation? Consider 3 Example Scenarios.
- jcond is about the same in regular region and film deficient region. No preferential correction possible.
If anything, Tfilm,def. > Tfilm in the initial cool down phase,
reversing to Tfilm,def. < Tfilm much later (when jcond is much smaller) as heat capacity and diffusion
interplay.
2. Uniform film formation but following energy deposition and evaporation, part of the Pb
film locally detaches (due to some instability).
In this case, Tfilm > Tfilm,def.
- Best scenario. Preferential condensation will occur
but how much correction can be achieved is not clear.
3. Film formation leaves dry local region. Following energy deposition and evaporation, local SiCf/SiC temperature > Pb film temperature (Tfilm<Tfilm,def.)
1.0x10-3
1.0x10-2
1.0x10-1
1.0x100
1.0x101
400 600 800 1000 1200 1400 1600
Pb Film Temperature (K)
Vapor Pressure (Pa)/Temp. (K)
100 Pa/1500 K
500 Pa/1500 K
3000 Pa/3000 K
104 Pa/104 K4x104 Pa/7x104 K
1. Uneven film formation leaves local region with much smaller thickness. Following energy deposition and evaporation, Tfilm is at the local BP everywhere (Tfilm = Tfilm,def.)
- Worse scenario. Solution must come from Pb injection from the inside rather than from condensation.
Porous medium would help as maximum temperature of bare surface would always be ~ T film.
Preferential condensation is scenario limited and cannot be relied upon to ensure film deficiency correction
January 1, 2002/ARR19
Aerosol Formation Based on Chamber Conditions
• Critical radius (at equilibrium) as a function of surface tension, vapor temperature, and saturation ratio
r* =2σM
ρfRTln(PgP∞
)
1.0x10-11
1.0x10-10
1.0x10-9
1.0x10-8
1.0x10-7
1.0x10-6
1 10 100 1000
Pb VaporTemp. (K)
1500200030005000800010,000
Saturation Ratio (Pinterface/Pinfinity)
January 1, 2002/ARR20
Droplet Nucleation Estimate Based on Classical Homogeneous Nucleation Theory
• Effective saturation ratio threshold depending on vapor temperature
• What saturation ratio can be achieved in IFE case?
January 1, 2002/ARR21
Droplet Growth Based on Kinetic Theory for Small Droplets
drdt
=3P∞
8hfgρf
3RTgM
⎛
⎝ ⎜ ⎜
⎞
⎠ ⎟ ⎟
0.5
(Tsat−Tg)
• For low Pb vapor pressure (~100 Pa) droplet growth does not seem to be a problem
• For higher Pb vapor pressure (~104 Pa), droplet growth could be a problem for low vapor temperature (< ~ 2000K) and high saturation ratio. However, this is an unlikely combination.
0.0x100
1.0x10-8
2.0x10-8
3.0x10-8
4.0x10-8
1 10 100 1000 10000
Saturation Ratio (Pinterface/Pinfinity)
Pb VaporTemp. (K)
1500
2000
Pb Vapor Pressure = 102 Pa
0.0x100
2.0x10-6
4.0x10-6
6.0x10-6
8.0x10-6
1.0x10-5
1.2x10-5
1.4x10-5
1 10 100 1000
Saturation Ratio (Pinterface/Pinfinity)
Pb VaporTemp. (K)
1500
2000
Pb Vapor Pressure = 104 Pa
Assuming heat removal through conduction
January 1, 2002/ARR22
Upper Bound Estimate of Combination of Number of Droplets and Droplet Size as a Function of Evaporated Film Thickness
What are the limits based on target and driver requirements?
Several Observations Emerged from the Condensation Scoping Study
• Above a certain “threshold” the condensation characteristic time to clear chamber does not change appreciably with vapor pressure and is much lower than the IFE time between shots
• Normal vapor velocity at the interface enhances condensation rate but by no more than about half an order of magnitude
• The presence of non-condensable gas can slow down condensation but effect important at Pg higher than anticipated for IFE
• Based on condensation, it seems somewhat better to have a shorter penetration depth (softer spectrum) resulting in less vapor at a higher temperature
• Correction on film thickness unevenness by preferential condensation can happen for a given scenario producing the required local film T. However, it cannot be relied upon and other means of correction are required to account for all possible scenarios.
• Aerosol formation could be a problem although it is not clear that IFE conditions would result in droplet growth (at least based on conduction)
What next?
• To shed more light on the evolution of chamber conditions between shots, it would be very useful to run an integrated model including film and drop condensation but also fluid dynamics and heat transfer with the right physics
January 1, 2002/ARR24
A Laser Material Ejecta Model is Being Developed as Part of UCSD’s Effort on Laser/Material Interaction
(D. Blair/M. Tillack)
• Model includes:- Laser energy depostion
- Ejecta (evaporation)
- Hydrodynamics
- Drop condensation
- Aerosol formation
- Film condensation
• Striking similarity with IFE armor case with only a few differences
- Different time scale (ns-ms modeling compared with up to 0.1 s for IFE)
- Different dimension (mm’s vs m’s for IFE)
- Laser energy deposition vs photon + ion energy deposition for IFE
- Geometry and boundary conditions
January 1, 2002/ARR25
Observations from Condensation Scoping Study
• Normal vapor velocity at the interface enhances condensation rate but by no more than about half an order of magnitude
• The presence of non-condensable gas can slow down condensation but effect important at Pg higher than anticipated for IFE
January 1, 2002/ARR26
Example Run Based on IFE-like Conditions (8 μs run)(Model needs to be further modified for detailed IFE analysis)
January 1, 2002/ARR27
Future Work
• Run IFE cases with modified laser ejecta code to better understand chamber conditions prior to each shot. E.g.
- Residual aerosol characteristics
- Vapor density, temperature and pressure
- Effect of background gas
- Effect of chamber size
- Effect of penetration depth
• Input on driver and target requirements
• Possibility of self-healing of film thickness deficiency
January 1, 2002/ARR28
Extra Slides
January 1, 2002/ARR29
Parametric Studies for Dry Wall with Direct Drive Target (LY) Under Constraint: Tmax,SiC/SiC < 1000°C
Direct Drive LY:Driver Energy = 1.2 MJGain = 128Yield = 153.6 MJDriver Efficiency = 0.07