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Introduction to the difraction analysis and SANS method Students: Dana-Maria GHITA (Univ. of Craiova, Romania) Nicoleta-Madalina GIURGEA (Univ. of Bucharest, Romania) Andreea OPREA (Univ. of Bucharest, Romania) Claudia-Teodora TEODORESCU-SOARE (Univ. of Jassy, Romania) Project Coordinators: Dr. M. L. CRAUS (FLNP) Dr. A. I. KUKLIN (FLNP) JINR Summer Student Practice 5-25 July 2010
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Introduction to the difraction analysis and SANS method

Jan 13, 2016

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Students: Dana-Maria GHITA (Univ. of Craiova, Romania) Nicoleta-Madalina GIURGEA (Univ. of Bucharest, Romania) Andreea OPREA (Univ. of Bucharest, Romania) Claudia-Teodora TEODORESCU-SOARE (Univ. of Jassy, Romania) Project Coordinators: Dr. M . L . CRAUS (FLNP) Dr. A . I. KUKLIN (FLNP). - PowerPoint PPT Presentation
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Page 1: Introduction to the difraction analysis and SANS method

Introduction to the difraction analysis and

SANS methodStudents:

Dana-Maria GHITA (Univ. of Craiova, Romania) Nicoleta-Madalina GIURGEA (Univ. of Bucharest, Romania) Andreea OPREA (Univ. of Bucharest, Romania) Claudia-Teodora TEODORESCU-SOARE (Univ. of Jassy, Romania)

Project Coordinators:

Dr. M. L. CRAUS (FLNP) Dr. A. I. KUKLIN (FLNP)

JINR Summer Student Practice 5-25 July 2010

Page 2: Introduction to the difraction analysis and SANS method

Part 1:Corelations between

structure and transport caracteristics

of manganites with Cr impurities (La0.54Ho0.11Sr0.35)

(Mn1-xCrx)O3

Page 3: Introduction to the difraction analysis and SANS method

Outline

Work done within the Project Overview Results Conclusions

Page 4: Introduction to the difraction analysis and SANS method

Work Done Within the Project

Manganite samples with the general structure La0.54Ho0.11Sr0.35Mn1-xCrxO3 have been studied using FullProf Suite code for existing data at (x = 0.05; 0.10; 0.15; 0.20).

The goal of investigation was to estimate qualitatively :

(1) the variation of the lattice constant values in terms of Cr impurity concentration

(2) microstrain and crystallite average size dependence on the Cr concentration.

Page 5: Introduction to the difraction analysis and SANS method

Outline

Work done within the Project

Overview Results Conclusions

Page 6: Introduction to the difraction analysis and SANS method

Overview

The samples: La0.54Ho0.11Sr0.35Mn1-xCrxO3 manganites were prepared by sol-gel

method using oxides and acetates and sintered in air at 1200

C for 15 h.

It is known:The samples show perovskite phases, with orthorhombic

structure (Space Group – P n m a). ABO3 perovskito-manganites determine the charge transport behavior and complex magnetic and crystalline structures.

X-ray data for samples (with different Cr concentrations) mentioned in our report was obtained with Hubber-Guinier diffractometer by using Cr Kα1 radiation and was handled using FullProf Suite code.

Page 7: Introduction to the difraction analysis and SANS method

Unit cell of manganite La0.54Ho0.11Sr0.35Mn1-xCrxO3

Features:

- Distorted Perovskite

- Orthorhombic space group: Pnma #62

- Primitive lattice (P)

- Glide plane (n) perpendicular to a axis

- Mirror plane (m) perpendicular to b axis

- Glide plane (a) perpendicular to c axis

Page 8: Introduction to the difraction analysis and SANS method

FullProf Main Features The program has been mainly developed for Rietveld analysis

(structure profile refinement) of neutron (nuclear and magnetic scattering) or X-ray powder diffraction data collected at constant or variable step in scattering angle 2θ

• X-ray diffraction data: laboratory and synchrotron sources.

• Neutron diffraction data: Constant Wavelength (CW) and Time of Flight (TOF).

• The scattering variable may be 2θ in degrees, TOF in microseconds and Energy in KeV.

• Background: fixed, refinable, adaptable, or with Fourier filtering.

• Choice of peak shape for each phase: Gaussian, Lorentzian, modified Lorentzians, pseudo-Voigt, Pearson-VII, Thompson-Cox-Hastings (TCH) pseudo-Voigt, numerical, split pseudo-Voigt, convolution of a double exponential with a TCH pseudo-Voigt for TOF.

• Multi-phase (up to 16 phases).

• Absorption correction for a different geometries. Micro-absorption correction for Bragg-Brentano set-up.

free program http://www.ill.eu/sites/fullprof/

Page 9: Introduction to the difraction analysis and SANS method

FullProf Main Features • Choice between automatic generation of hkl and/or symmetry operators

and file given by user.

• Magnetic structure refinement (crystallographic and spherical representation of the magnetic moments).

• hkl-dependence of the position shifts of Bragg reflections for special kind of defects.

• Profile Matching. The full profile can be adjusted without prior knowledge of the structure (needs only good starting cell and profile parameters).

• Quantitative analysis without need of structure factor calculations.

• Chemical (distances and angles) and magnetic (magnetic moments) slack constraints. They can be generated automatically by the program.

• The instrumental resolution function (Voigt function) may be supplied in a file. A microstructural analysis is then performed.

• Neutron (or X-rays) powder patterns can be mixed with integrated intensities of X-rays (or neutron) from single crystal or powder data.

• Full Multi-pattern capabilities. The user may mix several powder diffraction patterns (eventually heterogeneous: X-rays, TOF neutrons, etc.) with total control of the weighting scheme.

Page 10: Introduction to the difraction analysis and SANS method

Outline

Work done within the Project Overview

Results Conclusions

Page 11: Introduction to the difraction analysis and SANS method

Observed and calculated difractograms of

La0.54Ho0.11Sr0.35Mn0.95Cr0.05O3 (FullProf method)

Page 12: Introduction to the difraction analysis and SANS method

Observed and calculated difractograms of

La0.54Ho0.11Sr0.35Mn0.90Cr0.10O3 (FullProf method)

Page 13: Introduction to the difraction analysis and SANS method

Observed and calculated difractograms of

La0.54Ho0.11Sr0.35Mn0.85Cr0.15O3 (FullProf method)

Page 14: Introduction to the difraction analysis and SANS method

Observed and calculated difractograms of

La0.54Ho0.11Sr0.35Mn0.80Cr0.20O3 (FullProf method)

Page 15: Introduction to the difraction analysis and SANS method

Variation of the lattice constants and the unit cell volume (a,b,c,V) vs. Cr

concentration x

x a(Å) b(Å) c(Å) V(Å3)

0.05 5.4229 7.6628 5.4038 224.553

0.10 5.3786 7.5831 5.3924 219.937

0.15 5.3793 7.5922 5.3865 219.989

0.20 5.3767 7.5946 5.3823 219.780

Page 16: Introduction to the difraction analysis and SANS method

Variation of the microstrain Ɛ and of the apparent size of the crystallite vs. Cr

concentration x

x Ɛ D (Å)

0.05 0.0289579 467.86

0.10 0.0317542 423.55

0.15 0.0265669 712.69

0.20 0.0222624 601.97

Page 17: Introduction to the difraction analysis and SANS method

Outline

Work done within the Project Overview Results

Conclusions

Page 18: Introduction to the difraction analysis and SANS method

Conclusions to Part 1

Lattice constants a and c decrease decrease monotonicallymonotonically, while b and unit cell volume V vary non-monotonicallyvary non-monotonically with the Cr (chrome) concentration.

The microstrain shows a maximummaximum, while the average size of crystallites shows non-monotonicnon-monotonic variation with Cr concentration .

Page 19: Introduction to the difraction analysis and SANS method

Part 2 : SANS - Introduction•Small angle neuton scattering is a method of analisys used in research for the determination of the structures and parameters of different solid samples.

•The measured magnitude in a small angle scattering experiment is the intensity as a function of the momentum transfer Q=4π/λ sinΘ (scattering vector).

• SANS techniques:

-The pin-hole SANS covers the conventional range of 1 to 100nm. This range is exptended by the focusing SANS with either mirrors or lenses up to 1000nm.

-The double crystal (Bonse Hart) diffractometer reaches length scales in the μm range.

Page 20: Introduction to the difraction analysis and SANS method

Information which can be obtained by SANS

• Sizes, spatial correlations and shapes of particles, aglomerates, pores and fractals in crystalline and amorphous states, as well as in solutions on a length scale ranging from 1 nm up to several hundred nanometers

• Phase transitions

• Degree of polydispersity

• Aggregation numbers

• Molecular weight

• Geometric peculiarities

Page 21: Introduction to the difraction analysis and SANS method

Special methods

Contrast Variation Method– Determination of object density – Investigation of system homogeneity

Label Method– Analysis of density distribution inside the object under study

Page 22: Introduction to the difraction analysis and SANS method

1 – two reflectors;2 – zone of reactor with

moderator;3 – chopper;

4 – first collimator;5 – vacuum tube;

6 – second collimator;7 – thermostate;

8 – samples table;9 – Vn-standard;

10 – ring-wire detector; 11 – position-sensitive

detector "Volga";12 – direct beam

detector.

YUMO-Frank Laboratory of Neutron Physics, Joint Institute of Nuclear Physics, Dubna, Russia

Page 23: Introduction to the difraction analysis and SANS method

SAXS and SANS comparison

Commons: - elastic

- coherent

- magnetic scattering

- nuclear

Differences : SAXS - big scattering angle

- q range = 0.8 ÷1 Å-1

SANS - small scattering angle

- q range= 0.001 ÷1 Å-1

Page 24: Introduction to the difraction analysis and SANS method

Conclusions to Part 2

• SANS is a powerful method for the investigation of sizes, shapes and density of particles in the range of: 20 ÷ 10 000Å.

• The neutron measurements also enable the determination of magnetic correlations inside samples.

• Contrast variation methods in the SANS framework allow nuclear and magnetic density estimates.

• Etc.

Page 25: Introduction to the difraction analysis and SANS method

References• “Transport phenomena in La0.54Ho0.11Sr0.35Mn1-xCuxO3

manganites” Mihail-Liviu Craus1,2, Nicoleta Cornei 3, Ahmed Islamov2 and Vasyl M. Garamus4

• http://www.ill.eu/sites/fullprof/

• www.flnr.jinr.ru

• Neutron Scattering, Thomas Brϋckel, Gernot Heger, Dieter Richter and Reiner Zorn, RWTH Aachen, University of Mϋnster

• Perovskiti Magnetorezistivi: sinteza, proprietati si aplicatii, Mihail-Liviu Craus, Nicoleta Cornei, Mihai Lozovan, Viorel Dobrea, Iassy:Alfa, 2008

• An introduction to the program FullProf, Juan Rodríguez-Carvajal, Laboratoire Léon Brillouin (CEA-CNRS), CEA/Saclay, 91191 Gif sur Yvette Cedex, FRANCE

Page 26: Introduction to the difraction analysis and SANS method

Acknowledgments

• We are indebted to the Project leaders for their guidance &

patience.

• Thanks to the Direction and staff of UC for the nice

organization of the summer student practice

• Thanks to Prof. Dr. Gh. ADAM and Dr. S. ADAM for advice

during the Summer practice

• Thanks to Dr. O. CULICOV for the Reactor tour

• Also thanks to Phd. Student R. ERHAN for good advices during

the Summer practice

Page 27: Introduction to the difraction analysis and SANS method

Thank You for Attention!!

Thank you for attention!!