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Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department “G.Galilei”, University of Padova INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova TC19 Paris, 2006
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Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

Mar 26, 2015

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Page 1: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

Compositional and morphological characterizations by SIMS, RBS and AFM

Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department “G.Galilei”, University of Padova

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19 Paris, 2006

Page 2: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

I II

0 50 100 150 200 250 300 35010-1

100

101

102

103

104

105

106

Sample A

SIM

S Y

ield

(C

ount

s/s)

Depth (nm)

O Al Si Cr

SIMS Analysis

Sample A

Page 3: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

SIMS analysis pointed out that:

1. The sample is made of two layer deposited on the substrate, the total thickness being (152±6)nm (estimation made by referring to the FWHM of Si signal.

2. The first layer has a thickness of (107±3)nm, while the second layer has a thickness of (45±6)nm. Important: the depth is strongly affected by the surface roughness.

3. The first layer contains a significant content of Al, O and presence of Fe, Ni, Co. It presents a segregation peak of Cr at the interface with the second layer, whose composition is dominated by Cr and oxygen. At the interface with the substrate a segregation of Cr is observed.

Page 4: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

0 100 200 300 400 500100

101

102

103

104

105

106

Sample B

SIM

S Y

ield

(C

ount

s/s)

Depth (nm)

O Al Si Cr

SIMS Analysis

Sample B

Page 5: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

SIMS analysis pointed out that:

1. The sample is made of two layer deposited on the substrate, the total thickness being (151±6)nm (estimation made by referring to the FWHM of Si signal.

2. The first layer has a thickness of (107±3)nm, while the second layer has a thickness of (44±6)nm. Important: the depth is strongly affected by the surface roughness.

3. The first layer contains a significant content of Al, O and presence of Fe, Ni, Co. It presents a segregation peak of Cr at the interface with the second layer, whose composition is dominated by Cr and oxygen. At the interface with the substrate a segregation of Cr is observed.

Page 6: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

RBS analysis

Sample A

Compound AaBb where

1° layerAl = 2.00O = 3.10

2° layerCr = 1.00O = 0.10

Page 7: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

Sample B

Compound AaBb where

1° layerAl = 2.00O = 4.16

2° layerCr = 1.00O = 1.20

Page 8: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

AFM analysis and profilometer scans

Characterization of the ruler (Fig.1 sample A, position 1)

0 50 100 150 200 250

-2500

-2000

-1500

-1000

-500

0

500

1000

Ruler

Hei

ght (

A)

Position (m)

The estimation of the total length of 20 markers is: 185.9 0.4 m.

Page 9: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

SAMPLE B

Quality of the etched edges, height of the structure

Page 10: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

Description Mean value (m) (m) m (m)

Sharp edge steepness 0.280 0.60 0.020

Total height of the structure 0.189 0.006 0.002

Page 11: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

SAMPLE A

Mapping of the test structure in sample A (fig.2, position 2)

The scans of the deep groove evidenced an accumulation at the groove borders. The height Hg and the width Wg of the deep groove with respect to the flat surface (i.e. not considering these accumulations) was quantified: Hg=(0.190.01)m, Wg=(0.960.02)m respectively, the error being given by the maximum semi-dispersion.

Page 12: Compositional and morphological characterizations by SIMS, RBS and AFM Paolo Mazzoldi, N. Argiolas, G. Battaglin, C. Sada Physics Department G.Galilei,

INFM e Dipartimento di Fisica “G.Galilei”, Università degli Studi di Padova, Via Marzolo 8, 35100 Padova

TC19

The scans of the wall evidenced that the height Hw and the width Ww of the wall was respectively: Hw=(0.1950.007)m, Ww=(2.450.01)m respectively, the error being given by the maximum semi-dispersion.