08/24/09 13:45Instrumentation & Measurement Society1 IEEE Instrumentation and Measurement Society 2009.

08/24/09 13:45 Instrumentation & Measurement Society 1

IEEE Instrumentation and Measurement Society

2009


What Do We Do?

“To measure is to know”

---Lord Kelvin, 1883


History

• 1950 Professional Group on Instrumentation & Measurement founded as part of IRE

• 1952 began I&M Transactions• 1978 name changed to Instrumentation &

Measurement Society• 1984 first IMTC Conference• 1996 I&M Magazine replaces I&M Newsletter


Field of InterestThe Field of Interest of the Instrumentation and Measurement Society

encompasses measurement systems and science. The Society seeks to advance knowledge:

(1) in the theory, methodology, and practice of measurement, including, but not limited to, primary metrology, measurement uncertainty, and traceability;

(2) in the design, development and evaluation of measurement systems, or any of their components, involved in generating, acquiring, conditioning and processing signals for the purpose of measuring quantities and phenomena of interest;

(3) in the analysis, representation, display, and preservation of the information obtained from a set of measurements so as to best meet the needs of the end-user, whether human or machine; and

(4) through the establishment and maintenance of related technical standards.


I&M is Key

• Virtually ever specialization works with instrumentation & measurement

• …but the world doesn’t revolve around I&M!

Test

Control

Characterization

Sensing

I & M


The I&M Team

– AdCom Officers• Alessandro Ferrero, President

• Kim Fowler, Executive Vice-President

• M. Stephen Karlovic, Vice-President - Conferences

• Shreekanth Mandayam, Vice-President - Finance

– Frank Reyes, Treasurer

• Robert M. Goldberg, Vice-President - Publications

• Jorge F. Daher, Vice-President - Membership

• Kang Lee, Vice-President - Technical and Standards

• Stephen A. Dyer– Junior Past President

• Robert C. Rassa– Senior Past President

Website


The I&M Team (continued)

Administrative Committee

2006-2009Jorge F. Daher

Stephen A. DyerRichard C. Hochberg

Frank Reyes

2007-2010M. Stephen Karlovic

Shreekanth MandayamJ. Barry Oakes

Matteo Pastorino

2008-2011Ruth A. Dyer

Pasquale DaponteKim Fowler

John L. Schmalzel

2009-2012Mihaela Albu

Voicu Z. GrozaRobert R. Krchnavek

Daniel Rosenthal


7

1-6

910

8


AdCom Membership by Region

Region Number on AdCom1 3

2 3

3 2

4 0

5 2

6 1

7 1

8 3

9 1

10 0


AdCom Membership by Segment

Segment Number on AdCom

Industry 6

Academia 8

Retired 2


Membership


I&M Chapters

Region Chapters

1 4

2 1

3 1

4 2

5 0

6 2

7 2

8 12

9 2

10 4


Membership


Membership


Conferences

Photograph by Kim Fowler, used with permission


I&M Conferences

• International Instrumentation and Measurement Technology Conference (I²MTC)

• The Systems Readiness Technology Conference (AUTOTESTCON)


I&M Symposia

• Sensors Application Symposium (SAS)

• International Symposium on Precision Clock Synchronization for Measurement, Control, and Communication (ISPCS)

• IEEE International Symposium on Intelligent Signal Processing (WISP)


I&M Workshops

• Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA)

• Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems (VECIMS)

• Workshop on Medical Measurements and Applications (MeMeA) • Workshop on Advanced Methods for Uncertainty Estimation Measurement (AMUEM)• International Workshop on Imaging Systems and Technology (IST) • International Workshop on Haptic Audio-Visual Environments and Their Applications

(HAVE) • IEEE International Workshop on Robotic and SEnsors Environments (ROSE)• Workshop on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS)

• Workshop on Measurement Systems for Homeland Security, Contraband Detection and Personal Safety (MSHS)


Publications


I&M Publications

• Transactions on Instrumentation & Measurement• Instrumentation & Measurement Magazine• The I&M web site: www.ieee-ims.org• Co-Sponsored Publications:

– IEEE Transactions on Applied Superconductivity– Journal of Lightwave Technology– IEEE Sensors Journal– IEEE Transactions on Nanotechnology


Publications Team

• Robert Goldberg, Vice-President Publications– Reza Zoughi, Transactions Editor-in-Chief– Shlomo Engelberg, Magazine Editor-in-Chief


Standards Activity

• P1451.1 - Smart Transducer Interface for Sensors and Actuators: Network Capable Application Processor Model

• P1451.2 - Smart Transducer Interface for Sensors and Actuators: Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet Formats

• STD-1241 – A/D Converter Terminology and Test Methodology


Technical Committees

TC-1 Measurement Precision, Sensitivity and Noise

TC-2 DC-LF Measurement

TC-3 Frequency and Time

TC-4 High-Frequency Measurement

TC-6 Emerging Technologies in Measurements

TC-7 Signals & Systems in Measurement

TC-8 Test and Instrument Systems

TC-9 Sensor Technology

TC-10 Waveform Generation Measurement and Analysis

TC-11 SCC-20 ATLAS Coordinator

TC-13 Wireless and Telecommunications in Measurements

TC-15 Virtual Systems in Measurements


Technical Committees (continued)

TC-16 Laser and Optical Systems in Measurements

TC-17 Materials in Measurements

TC-18 Environmental Measurements

TC-19 Imaging Measurements

TC-20 Transportation Systems in Measurements

TC-21 Self-Test and Built-in Test

TC-22 Intelligent Measurement Systems

TC-23 Education in Instrumentation and Measurements

TC-24 Measurement Microsystems

TC-25 Medical and Biological Measurements

TC-26 Radar Cross-Section Measurements

TC-27 Human Computer Interface and Interaction


Technical Committees (continued)

TC-28 Instrumentation for Robotics and Automation

TC-30 Security and Contraband Detection

TC-31 I&M For Homeland Security

TC-32 Fault Tolerant Measurement Systems

TC-33 Characterization of Electrical and Optical Nonlinear High Frequency Components

TC-34 Nanotechnology in Instrumentation and Measurement

TC-35 Netcentric Operations Interoperability

TC-36 Industrial Inspection

TC-37 Measurements for Networking

TC-38 Space Measurements

TC-39 Measurements in Power Systems

08/24/09 13:45Instrumentation & Measurement Society1 IEEE Instrumentation and Measurement Society 2009.

Documents

measurement society2009082409

measurement uncertainty

practice of measurement

instrumentation measurementbut

ieee instrumentation

im newsletter082409

im transactions1978

vicepresident technical