Documents New Burn In (BI) Methodology for testing of blank Actel 0.15 m RTAX-S FPGAs September 7 th – 9...

New Burn In (BI) Methodology for testing of blank Actel 0.15m RTAX-S FPGAs September 7th – 9th, 2005 Minal Sawant Solomon Wolday Paul Louris Dan Elftmann New BI Methodology…