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Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation
Technology Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation

1.International Journal on Computational Sciences & Applications (IJCSA) Vol.4, No.3, June 2014 DOI:10.5121/ijcsa.2014.4311 117 EFFECT OF MESH GRID STRUCTURE IN REDUCING…

IRJET-Evaluation path way of Schmitt Trigger with Leakage Reduction Techniques
Documents IRJET-Evaluation path way of Schmitt Trigger with Leakage Reduction Techniques

International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395 -0056 Volume: 02 Issue: 04 | July-2015 www.irjet.net p-ISSN: 2395-0072 © 2015, IRJET.NET-…

Radiation monitoring at the new GIF++ irradiation facility at CERN
Documents Radiation monitoring at the new GIF++ irradiation facility at CERN

Institute for Nuclear Research and Nuclear Energy Dimitrov L.P., Iaydjiev P.S., Mitev G.M., Vankov I.V. GIF++ GIF++ is a new Gamma Irradiation Facility being built at CERN.…

Institute for Nuclear Research and Nuclear Energy Dimitrov L.P., Iaydjiev P.S., Mitev G.M., Vankov I.V.
Documents Institute for Nuclear Research and Nuclear Energy Dimitrov L.P., Iaydjiev P.S., Mitev G.M., Vankov.....

Institute for Nuclear Research and Nuclear Energy Dimitrov L.P., Iaydjiev P.S., Mitev G.M., Vankov I.V. GIF++ GIF++ is a new Gamma Irradiation Facility being built at CERN.…

Energy Efficiency and Process Variation Tolerance of 45 nm Bulk and High-k CMOS Devices
Documents Energy Efficiency and Process Variation Tolerance of 45 nm Bulk and High-k CMOS Devices

Subthreshold Voltage High-k CMOS Devices Have Lowest Energy and High Process Tolerance Energy Efficiency and Process Variation Tolerance of 45 nm Bulk and High-k CMOS Devices…

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