Figure 10-1 Testing AND and OR Gates for Stuck-at Faults 0 1 0 a 1 b 1 c (b) 1 1 0 0 0 a b c (d) 1 1 1 a b c (a) 1 0 0 1 0 0 0 1 a b c (c) 0 1 0 Fig. 10-2 Testing an AND-OR…
Intro to IEEE 1149.1 Boundary-Scan (JTAG) David Lavo [email protected] UC Santa Cruz January 27, 2005 Outline • • • • • What is 1149.1? 1149.1 Basics Documentation…
IEEE 1149.1 JTAG Boundary Scan Standard 1 Motivation Bed-of-nails printed circuit board tester gone We put components on both sides of PCB & replaced DIPs with flat packs…
JTAG (JOINT TEST ACTION GROUP) By Arthi Varadarajan ([email protected]) Topics Discussed…. n n n n n BED OF NAILS(BON TESTER) What is JTAG ??? Advantages Boundary Scan…
IEEE 1149.1 JTAG Boundary Scan Standard 1 Motivation Bed-of-nails printed circuit board tester gone ¾ We put components on both sides of PCB & replaced DIPs with flat…
1.Harry BleekerPeter van den EijndenFrans de JongThis book will act as an introduction as well as a practical guide toBoundary-Scan Testing. The ever increasing miniaturization…
Slide 1 JTAG over the internet! Slide 2 The problem Until now device testing was physically (geographically) limited as the DUT (device under test) and the TAP controller…
Slide 1 Feng-Xiang Huang A Design-for-Debug (DfD) for NoC-based SoC Debugging via NoC Hyunbean Yi 1, Sungju Park 2, and Sandip Kundu 1 1 Department of Electrical & Computer…