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Documents Petta Lab Raith Guide v1

Petta Lab Raith EBL Guide Bart H. McGuyer July 9, 2007 This document is a guide for performing electron beam lithography (EBL) with the PRISM Raith e LiNE system, and is…

Technology Charm 050222

1. Titan: First Views of an Alien World Jonathan I. Lunine The University of Arizona 2. Titan is… … a natural satellite of Saturn. …one…

Design Introduction: Making Urban Environments Age-Friendly (UK Urban Ageing Consortium) UK Network of...

Making urban environments Age-Friendly (a brief introduction) Sophie Handler Manchester City Council / University of Manchester [email protected] WHO Age-Friendly…

Documents Embedded meets Agile

1. AGILE PROJECT MANAGEMENT For Embedded Systems Development Ravneet Kaur Software Process Manager Philips 2. “It is possible to finish on schedule and under budget but…

Documents UNIT 7: Micro-manufacturing Unit 7 Copyright © 2014. MDIS. All rights reserved. 1 Modern...

Slide 1 UNIT 7: Micro-manufacturing Unit 7 Copyright © 2014. MDIS. All rights reserved. 1 Modern Manufacturing Slide 2 2 Objectives Unit 7Copyright © 2014. MDIS. All rights…

Documents 1 Resist Heating Dependence on Subfield Scheduling in 50kV Electron-beam Maskmaking S. Babin *, A.B....

Slide 1 1 Resist Heating Dependence on Subfield Scheduling in 50kV Electron-beam Maskmaking S. Babin *, A.B. Kahng, I.I. Mandoiu, S. Muddu CSE & ECE Depts., University…

Documents 1 Subfield Scheduling for Througput Maximization in Electron-beam Photomask Fabrication S. Babin *,....

Slide 1 1 Subfield Scheduling for Througput Maximization in Electron-beam Photomask Fabrication S. Babin *, A.B. Kahng, I.I. Mandoiu, S. Muddu CSE & ECE Depts., University…

Documents Peter Matheu EE 235 – “Nanoscale Fabrication” Professor Connie Chang-Hasnain

Outline Introduction to Nanoimprint Lithography (NIL) Promise UV curing for NIL Motivation for work Cross-bar circuits Single layer resist NIL Issues Best line patterns with…

Documents Testing Insepction

Increasing Responsiveness and Economy of Software Inspection Marko Komssi [email protected] 2004-12-03 2 Contents Problems with inspection processes and rules Generating…

Documents Subfield Scheduling for Througput Maximization in Electron-beam Photomask Fabrication

Subfield Scheduling for Througput Maximization in Electron-beam Photomask Fabrication S. Babin*, A.B. Kahng, I.I. Mandoiu, S. Muddu CSE & ECE Depts., University of California,…