1. Foster Rush Leading Edge Materials Technology ConsultingRecent Developments in theAdoption of Nano- Technology for Electronic ComponentsBrian C. Foster 2. Outline •…
1. www.ledtecasia.comMarch 28(Wed) - 30(Fri), 2012 / Suntec Singapore 2. SINGAPORE!A global business hub for the LED industry KoreaJapanIran ChinaPakistan Departure PointUAEIndiaHong…
1. An Introduction to Statistical ProcessControl (SPC) and Process CapabilityEstimation (Cpk)Robert W. SherrillASQ Certified Quality Manager 2. Training objectives1. To understand…
Slide 1 Electrical and optical properties of thin films [email protected] Slide 2 Outline Metallic films –Thickness dependent resistivity –Limit of Ohm’s law –Metallization…
Slide 1 1 The 1.7 kg Microchip Eric Williams, United Nations University Robert U. Ayres, INSEAD Miriam Heller, NSF Slide 2 2 Motivations Growth of IT industry: macro-economic…
Summer 2003 Yield Management Solutions62 Product News TeraScan⢠DUV Reticle Inspection System TeraScan system is the first deep ultraviolet (DUV) reticle inspection tool…
1. Manufacturing Execution System Oliver L. Hung 11-09-2003 2. Definition MES are at the heart of CIM.The simplest model of CIM has MES as the middle ground between ERP systems…