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ChemE 554 Nano Science I Rheology and Processes in Nanotechnology Instructor: René M. Overney [email protected] http://depts.washington.edu/nanolab/ Department of…

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Slide 1 INVESTIGATION OF THIN FILMS AND CLUSTERS BY SCANNING PROBE TECHNIQUES Natascha Niermann, concerning the phd progamm FB Physik, Surface Physics Universität Osnabrück,…

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Sample The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter. The tip is