STANDAHI) 4!UitDNANC:E sl3cONII) MBITION 1944 vo1AmlE * IIP Office Chief of of the Ordnance Division D. Technical WASHINGTON, C. R FIXED b FLEXlBLE I ARD RtCHT SIDE V1EW…
Slide 1 Atomic Force Microscopy: characterization of surface topography Andrius Martinavičius Slide 2 AFM schematically Most AFMs use a laser beam deflection system, introduced…