Name: Jie He UTA ID#: 1000568567 Experiment: SEM 1. Introduction The Scanning Electron Microscope (SEM) is a microscope that uses electrons rather than light to form an image.…
1. Sharif University of Technology Kamal Asadi Pakdel 2. Lise Meitner Pierre Auger 3. The Auger Process K L M Vacuum Level Eject core electron Higher electron falls into…
APPLICATION OF SCANNING ELECTRON MICROSCOPY AND TRANSMISSION ELECTRON MICROSCOPY IN NANOTECHNOLOGY GUIDED BY: PRESENTED BY : Dr.SAMEER PATEL NEHAL LAKUM ID-10MPHPT006 P’CETICAL…
Slide 1 UWO Nanofabrication Facility and Science Studio Slide 2 Facility to be hooked into Science Studio: Western Nanofabrication Facility, University of Western Ontario…
Progress of the sub-harmonic bunching system (i.e. upgrading progress of BEPCII present bunching system) Pei Shilun for the SHBS team Accelerator center, IHEP May 10, 2007…
Contamination Specification for Dimensional Metrology SEMs András E. Vladár, K. P. Purushotham and Michael T. Postek National Institute of Standards and Technology (NIST),…
CONVERSION EFFICIENCY AT 250 GeV A.Mikhailichenko Cornell University, LEPP, Ithaca, NY 14853 Presented at Positron Source Meeting Daresbury Laboratory, UK 29-31 October 2008…
Gamma Irradiation Group 6 SHAHMILA A/P SHANMUGAM AN120225 KHAIRUL ANWAR BIN ROSLI AN120228 NUR ELLYNA BINTI YUSUF WOO AN120227 Overview Principles of Operation - How Gamma…
PowerPoint Presentation Electromagnetic Calorimeter for HADES at SIS100: MAMI and CERN test results Lead-glass modules Tests - g beam at MAMI energy resolution - p-/e- beam…
PowerPoint Presentation Test of Electromagnetic Calorimeter modules for HADES, Mainz Sep.2009 Krása, F. Křížek, J. Pietraszko, Y. Sobolev, J. Stanislav, A. Reshetin,…