Slide 1 2003Agrawal: Digital Test and DFT1 Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va…
Slide 1 Testing 1 Slide 2 2 Problems of Ideal Tests n Ideal tests detect all defects produced in the manufacturing process. n Ideal tests pass all functionally good devices.…