1. F ASTECHS YNERGYL TD Leading-edge Solutions for Niche Customers 2. 26 years in Semiconductor Manufacturing business with 900+ employees Established in 1983 as Circuit…

Slide 1Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 23/19alt1 Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence) n…

1. AMBA BUSAdvanced Micro controller Bus Architecture By ROHIT Y SHANBHAG 2. Overview of the AMBA SpecificationThe Advanced Micro controller Busarchitecture (AMBA) specification…

1300 Henley Court Pullman, WA 99163 509.334.6306 www.digilentinc.com NetFPGA-1G-CML™ Board Reference Manual Revised January 28, 2014 This manual applies to the NetFPGA-1G-CML…

Slide 1Copyright 2001, Agrawal & BushnellLecture 12: DFT and Scan1 VLSI Testing Lecture 10: DFT and Scan n Definitions n Ad-hoc methods n Scan design  Design rules…

Slide 1We live in a volatile world Vice President & COO [email protected] Slide 2 Slide 3 DoD Operating & Support Costs vs. Investment % of DoD BA (Includes OCO)…

Slide 1 Dec 21, 2007DfT@IITK1 Design for Testability Virendra Singh Indian Institute of Science Bangalore virendra@ {computer, ieee}.org IEP on Digital System Synthesis at…

Slide 1 Slide 2 1 Techniques for automated localization and correction of design errors Jaan Raik Tallinn University of Technology Slide 3 2 Design error debug “There has…

Slide 1 1 Lecture 23 Design for Testability (DFT): Full-Scan n Definition n Ad-hoc methods n Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads…

Slide 1 CPSCS614:Graduate Computer Architecture Static Pipelining #2 and Goodbye to Computer Architecture Prof. Lawrence Rauchwerger Based on Lectures by Prof. David A. Patterson…