Documents Abraham q3 2008

1. Nanometer Testing: Challenges and Solutions Jais AbrahamAMD India Design Centre 2. Characteristics of Nanometer DevicesDesign trendsIncreasing corners of operation (multiple…

Documents How Significant Is the Effect of Faults Interaction on Coverage Based Fault Localizations?

Slide 1 How Significant Is the Effect of Faults Interaction on Coverage Based Fault Localizations? Xiaozhen Xue Advanced Empirical Software Testing Group Department of Computer…