Documents ISQED 2007Cho et al. A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI.....

Slide 1ISQED 2007Cho et al. A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology Choongyeun Cho 1, Daeik Kim 1, Jonghae Kim 1, Jean-Olivier…