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Documents Status and future measurements on Micron detectors Outline: Irradiation and measurement in dry...

Slide 1Status and future measurements on Micron detectors Outline: Irradiation and measurement in dry atmosphere Measurements in vacuum Slide 2 Irradiation and measurement…

Documents 1. 2 Collaborators EXPERIMENT Duc Nguyen, 3 rd year student UNM/AFRL RVSE Camron Kouhestani, 3 rd...

Slide 11 Slide 2 2 Collaborators EXPERIMENT Duc Nguyen, 3 rd year student UNM/AFRL RVSE Camron Kouhestani, 3 rd year student UNM/AFRL RVSE Rod Devine, Think Strategically/AFRL…

Documents Texas Instruments James F. Salzman Distinguished Member Technical Staff Director of Technology,...

Slide 1Texas Instruments James F. Salzman Distinguished Member Technical Staff Director of Technology, Radiation Effects [email protected] Radiation Effects, and Solutions for…

Technology Another Approach to Instance Migration

1. Nannette Liske, Christian Stahl, Niels Lohmann, Karsten Wolf Humboldt Univ. Techn. Univ. University ofBerlinEindhovenRostock Another Approach to Service Instance Migration…

Documents Latent Noise in Schottky Barrier MOSFETUPoN 20081 Latent Noise in Schottky Barrier MOSFET Sheng-Pin....

Slide 1 Latent Noise in Schottky Barrier MOSFETUPoN 20081 Latent Noise in Schottky Barrier MOSFET Sheng-Pin Yeh, Chun-Hsing Shih*, Jeng Gong, and Chenhsin Lien Institute…

Documents RFAD LAB, YONSEI University NATURE | VOL 408 | 23 NOVEMBER 2000 | Optical gain in silicon...

Slide 1 RFAD LAB, YONSEI University NATURE | VOL 408 | 23 NOVEMBER 2000 |www.nature.com Optical gain in silicon nanocrystals L. Pavesi*, L. Dal Negro*, C. Mazzoleni*, G.…

Documents AUTOMATIC CONCOLIC TEST GENERATION WITH VIRTUAL PROTOTYPES FOR POST-SILICON VALIDATION Reviewer:...

Slide 1 AUTOMATIC CONCOLIC TEST GENERATION WITH VIRTUAL PROTOTYPES FOR POST-SILICON VALIDATION Reviewer: Shin-Yann Ho Instructor: Jie-Hong Jiang Slide 2 Abstract  This…

Documents Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements...

Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements Erik C. Garnett, Yu-Chih Tseng, Devesh R. Khanal, Junqiao Wu, Jeffrey Bokor,…

Documents LHCC status and outlook report June 4 2014 Jorgen Christiansen on behalf of RD53

PowerPoint Presentation ATLAS/CMS/LCD RD53 collaboration: Pixel readout integrated circuits for extreme rate and radiation LHCC status and outlook report June 4 2014 Jorgen…

Documents Au-Zn Eutectic

GOALI: Growth-dependent identification and control of defects and dopants in ZnO – DMR 0513968 L. J. Brillson and D. C. Look A major objective of this research is to understand…