Slide 1Time-of-flight measurement of ion energy Tim Freegarde Dipartimento di Fisica Università di Trento Italy Slide 2 2 Time-of-flight measurement of ion energy basic…

Slide 1 Ion Implantation A summary to aid you in studying for the exam Slide 2 Agenda Quick recap Stopping Projected range Implantation damage Advantages/disadvantages Slide…

X-ray absorption spectroscopy (XAS) I(x) = I0 e-µx µ = linear attenuation coefficient (depends on material and photon energy). The lost part is due to absorption. In…

Rutherford Backscattering Spectrometry (RBS) RBS RBS is an ion scattering technique that is used for the surface layer analysis of solids. A target is bombarded with ions…

Channeling in Direct Dark Matter Detection Daily Modulation of the Dark Matter Signal in Crystalline Detectors Nassim Bozorgnia UCLA TexPoint fonts used in EMF. Read the…

Slide 1 Secondary Ion Mass Spectrometry Professor Paul K Chu Slide 2 Secondary Ion Mass Spectrometry (SIMS) Slide 3 Sputtering by Elastic Collisions Single knock-on

Chapter 4 Discharges, Plasmas, and Ion-Surface Interactions Discharges, Plasmas, and Ion-Surface Interactions Sputtering An ionized gas or plasma active electrodes that participate…