Documents M. Fadlallah 1,3 , G. Ghibaudo 1 , J. Jomaah 1 and G. Guégan 2

Influence of ultra-thin gate oxide on the electric performance and low frequency noise of sub -0.1µm NMOSFETs M. Fadlallah1,3, G. Ghibaudo1, J. Jomaah1 and G. Guégan2 1)IMEP/LPCS,…