Slide 1Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest…
Slide 1 1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest n Directed search n Cost functions n Genetic…