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1. PATENTONELECTRON MICROSCOPE 2. Applicants : HITACHI HIGH TECH CORPORATIONInventors : ONISHI TAKASHIWATANABE SHUNICHIICHIHASHI MIKIOApplication No : 11783579Application…

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1. PATENT ON ELECTRON MICROSCOPE 2. Applicants : HITACHI HIGH TECH CORPORATION Inventors : ONISHI TAKASHI WATANABE SHUNICHI ICHIHASHI MIKIO Application No : 11783579 Application…

Documents IB Physics 12 Mr. Jean October 30 th, 2014. The plan:

IB Physics 12 Mr. Jean October 30th, 2014 The plan: How to control electric potential: The wire serves as a sort of charge pipe through which charge can flow. Conventional…

Documents ILC / CLIC Common issues for Compton

ILC / CLIC Common issues for Compton Brief review of Compton polarized positron source before today’s issues. This is related to short damping time, pre-DR ?, Ne in Compton…

Documents Update on JLab MEIC Project Vasiliy Morozov for JLab’s MEIC Study Group EIC Generic Detector R&D.....

Update on JLab MEIC Project Vasiliy Morozov for JLab’s MEIC Study Group EIC Generic Detector R&D Advisory Committee Meeting, BNL, January 13, 2014 V.S. Morozov January…

Documents Simulation Study For MEIC Electron Cooling He Zhang, Yuhong Zhang

PowerPoint Presentation Simulation Study For MEIC Electron Cooling He Zhang, Yuhong Zhang Thomas Jefferson National Accelerator Facility Abstract Electron cooling of the…