Documents 1 Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital...

Slide 1 1 Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits NBTI impact mitigation techniques Guard-banding Size up…

Documents On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits

On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits Department of Electrical and Computer Engineering By Han Lin Jiun-Yi Lin 05/14/2014 Overview…

Documents NBTI impact mitigation techniques Guard-banding Size up devices Toggle circuit nodes

* Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits NBTI impact mitigation techniques Guard-banding Size up devices…