Documents ToF-SIMS – Time of Flight-Secondary Ion Mass Spectroscopy A surface analytical technique.

Slide 1ToF-SIMS – Time of Flight-Secondary Ion Mass Spectroscopy A surface analytical technique Slide 2 Routine analytical technique Detailed chemical structure information…

Documents Lecture 13. TOF-SIMS Mass Spectroscopy. Routine analytical technique Detailed chemical structure...

Slide 1 Lecture 13. TOF-SIMS Mass Spectroscopy Slide 2 Routine analytical technique Detailed chemical structure information High sensitivity New primary ion sources (Au,…