Documents Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction X. Marti,....

Slide 1 Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction X. Marti, V. Holy Charles University, Prague P. Ferrer, T. Schulli ESRF,…

Documents Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction

Slide 1 Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction X. Marti, V. Holy Charles University, Prague P. Ferrer, T. Schulli ESRF,…