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The Microanalytical Research Centre

David N. Jamieson,

and Steven Prawer, David Hoxley

School of Physics, Microanalytical Research Centre, University of Melbourne, AUSTRALIA

Work supported by the Australian Research Council and the Visiting Fellowship Scheme of the University of Melbourne

http://www.ph.unimelb.edu.au/~dnj

SUPPLEMENTMicroanalytical Research CentreM A R C

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Single ion tracks

Latent damage from single-ion irradiation of a crystal(230 MeV Au into Bi2Sr2CaCuOx)

Lighter ions produce narrower tracks!

(Huang and Sasaki, “Influence of ion velocity on damage efficiency in the single ion target irradiation system” Au-Bi2Sr2CaCu2Ox Phys Rev B 59, p3862)

1 m

3 m

5 m

7.5 m

Depth

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Self Assembled Monolayers for nanofabrication

Monolayer deposition

Contact formation

AFM images of end-groups

Credits:A: www.ifm.liu.se/Applphys/ftir/sams.htmlB-D: IBM Research Labs www.zurich.ibm.com/~bmi/sams.html

A

B

C

D

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MeV ion etch pits in track detector

Heavy ion etch pit

Single MeV heavy ions are used to produce latent damage in plastic

Etching in NaOH develops this damage to produce pores

Light ions produce smaller pores

1. Irradiate 2. Latent damage

3. Etch

From: B.E. Fisher, Nucl. Instr. Meth. B54 (1991) 401.

Scale bars: 1 m intervals

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