8/8/2019 Augmenting Legacy Ate
1/26
AUGMENTING LEGACY
AUTOMATIC TEST EQUIPMENT (ATE)
FOR FUNCTIONAL TEST USING
NXTEST TECHNOLOGY
to
JDMAG/JTEG
7 November, 2001
8/8/2019 Augmenting Legacy Ate
2/26
Agenda
Legacy ATE Background
Functional vs Parametric Test
COSSI and NxTest Technology Demonstrated Results
Conclusions
8/8/2019 Augmenting Legacy Ate
3/26
Legacy ATE
ATE
Stimulus1 Stimulus2Measurement1 Measurement2Processor
Serial Processing
ATE ApplicationsTest Avionics LRUs and SRUs
Detect and Isolate Failures
Legacy ATE OperationSingle Test Setups/Measurements are MadeTests are Performed Serially
One Parameter Verified at a Time (Parametric)
8/8/2019 Augmenting Legacy Ate
4/26
What is Functional Test?
Functional Test is a test philosophy
that simulates the UUT operating
environment then verifies the unit
operates correctly in thatenvironment
8/8/2019 Augmenting Legacy Ate
5/26
The Key to Functional Test
PARAMETRIC MEASUREMENT
(General Purpose ATE) FUNCTIONAL MEASUREMENT
UUT
8/8/2019 Augmenting Legacy Ate
6/26
Functional Test Benefits
Reduce Cannot Duplicate (CNDs) Re-Test OK
(RTOK) etc. by testing UUTs in their operating
environment.
Leverages native diagnostics such as Built-In-Test (BIT)
Operational requirements verified. Keeps
good units out of the pipeline
Fast testing due to parallel, simultaneousstimulus and measurement
8/8/2019 Augmenting Legacy Ate
7/26
Historic Perspective
Functional Test Shortcomings
Requires Custom Hardware
Either in test station or in adapter
Requires Custom Software
Multiple stimulus and measurement
8/8/2019 Augmenting Legacy Ate
8/26
Functional Test System
Processor
Stimulus1
Stimulus2
Stimulus3
Measurement1
Measurement2
Measurement3
IATS
Parallel Processing
AirSim
Intermediate Avionics Test Station (IATS)Dedicated, Functional Tester for F/A-18 WRAs
Avionics Hardware Elements in the Tester
Parallel Stimulus/Measurement Capability
Fast Runtimes = User Satisfaction
8/8/2019 Augmenting Legacy Ate
9/26
COSSI Program
A COSSI* program with the Navy addresses
the challenge of adapting new technology to
augment a legacy ATE to provide functional
test capability and offload an obsolete tester.
IATS
Functional Tester Requiring Offload
CASS
Parametric Legacy ATE
Functional = Parametric
*Commercial Operations and Support Savings Initiative (COSSI)
8/8/2019 Augmenting Legacy Ate
10/26
COSSI Challenge
Augment an existing test station to perform
functional test using Commercial hardware and
software without sacrificing compatibility with
existing TPS Provide a structured TPS development
environment to reduce development costs
while reducing software maintenance
Develop an architecture which allows forinstrument replacement without significant
impact to TPS software
8/8/2019 Augmenting Legacy Ate
11/26
Next Generation Test Requirements
Functional Test
Simultaneous Stimulus
and Measurement
Synthetic Instrumentation
Flexible architecture
Open architecture
industry standards
Programmable
Tumblers
COSSI
Commercial Operations
and Support SavingsInitiative
Apply commercial
equipment and standards
to existing equipment.
NxTest
Simultaneous Stimulus
and Measurement
Synthetic Instrumentation
Flexible Architecture
Open architecture
industry standards
8/8/2019 Augmenting Legacy Ate
12/26
Functional Test/Real-Time Testing
Teradyne Analog Test Instrument (ATI) - AI-710 Tester-Per-Pin
Industrys first mixed-signal subsystem
Multiple Parallel Analog Channels:
32 Independent Channels per card and 192 total instruments Eliminates need for switching
Currently limited to low analog frequency
Simultaneous Source/Measure Capability: 6 independent instruments per channel
Function Generator (sine, square, triangle, sawtooth, etc) ArbitraryWaveform Generator
DMM
Timer/Counter
Limit Detector
Digitizer
Shared
Triggering
8/8/2019 Augmenting Legacy Ate
13/26
ATI in CASS
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMM
Digitizer
Timer/CounterLimit Detector
Function GenAWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMMDigitizer
Timer/CounterLimit Detector
Function Gen
AWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMM
DigitizerTimer/CounterLimit Detector
Function Gen
AWGDMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
ATI
Current CASS
ATI ATIGPI
ATI can use:
64 pins x 6 instr/pin = 384 instruments
Current GPI uses 1 instrument at a time
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMM
Digitizer
Timer/CounterLimit Detector
Function GenAWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMMDigitizer
Timer/CounterLimit Detector
Function Gen
AWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMM
DigitizerTimer/CounterLimit Detector
Function Gen
AWGDMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function GenAWG
DMMDigitizer
Timer/Counter
Limit Detector
Function Gen
AWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMMDigitizer
Timer/CounterLimit Detector
Function Gen
AWG
DMM
Digitizer
Timer/Counter
Limit Detector
Function GenAWG
DMM
Digitizer
Timer/Counter
Limit Detector
8/8/2019 Augmenting Legacy Ate
14/26
Resource
Manager
Handler
COSSI Software Architecture
COMMERCIAL TEST EXECUTIVE
Functional Test Manager
Resource
Manager
Handler
VPP
IVI
CUSTOM
LEGACY
INSTRUMENTATION
NEW
INSTRUMENTATION
Resource
Manager
Handler
Resource
Manager
Handler
8/8/2019 Augmenting Legacy Ate
15/26
Upgrade Kit
+ =
CASSCASS COSSI KitCOSSI Kit
ATI VXI Modules
Cables Software
8/8/2019 Augmenting Legacy Ate
16/26
COSSI Proof of Concept
Performance Demonstration held Aug 14-15.
Build a partial ID
Currently all wire
Used for both CASS and COSSI Enabled CASS Run a representative group of tests on each
following:
IATS for benchmark
Legacy CASS
COSSI Enabled CASS
8/8/2019 Augmenting Legacy Ate
17/26
COSSI Proof of Concept Demo
0
100
200
300
400
Run Time
UUT 1 UUT 2COSSI CASS
IATS
CASS (Projected)
8/8/2019 Augmenting Legacy Ate
18/26
Conclusions
COSSI successfully demonstrated in a real
world situation
NxTest technology enables Functional Testwhile reducing custom hardware requirements
Those technologies can be installed into
legacy systems to provide significantperformance enhancement while maintaining
compatibility with existing test programs
8/8/2019 Augmenting Legacy Ate
19/26
Backup
8/8/2019 Augmenting Legacy Ate
20/26
COSSI OVERVIEWKit Benefits
Cost Reduction TPS Development
Reduced runtimes
Less time spent in integration
Less on-station time less station maintenance
Reduced ID complexity Direct connections to 96 instruments channels
Reduced switch tree/matrix requirements
Reduced ID density
Some UUT interfaces can be emulated in software
Software on PC can provide realtime feedback functions to UUT thru
Ai7
Realtime adjust to reach capability
ID circuitry not required
Enhanced debug features
Simultaneous stim/measurement on each Ai7 channel
8/8/2019 Augmenting Legacy Ate
21/26
Functional Testing
Analog Test Instrumentation (Ai7) channels enablefaster, more effective test of UUTs
Test techniques applicable to Legacy test program*performance/diagnostic strategies
Single input, multiple outputs
Multiple inputs, single outputs
One time capture, multiple analyses of waveform
Parallel execution of independent test sequences
Diagnostic pre-fetch (capture test point data concurrent withperformance test)
*Note: These techniques can be implemented
WITHOUTAFFECTING the DIAGNOSTIC REASONING and FLOW PROCESS
8/8/2019 Augmenting Legacy Ate
22/26
UUT Functional Testing Examples
Legacy Test Flow
3 Sequential Tests
Apply Input to A
-Measure/Verify Output 1-Measure/Verify Output 2
-Measure/Verify Output 3
Ai7 Enabled Test Flow
3 Parallel Tests
Apply Input to A
-Measure /Verify Outputs 1,2,3(simultaneously)
UUT with single input to multiple outputs
UUT
Input Output
A 1
2
3
8/8/2019 Augmenting Legacy Ate
23/26
UUT Functional Testing Examples
Legacy Test Flow
3 Sequential Tests
Apply Input to A
-Measure/Verify Output 1
Apply Input to B
-Measure/Verify Output 1
Apply Input to C
-Measure/Verify Output 1
Ai7 Enabled Test Flow
1 Composite Test
Apply Inputs to A, B, C
(simultaneously)
-Measure /Verify Output 1
UUT with multiple inputs to single output
1
UUT
OutputInputA
B
C
8/8/2019 Augmenting Legacy Ate
24/26
UUT Functional Testing Examples
Legacy Test Flow
3 Sequential Tests
Input to A
-Measure/Verify Output 1 AC
Voltage
-Measure/Verify Output 1
Frequency
-Measure/Verify Output 1 DC
Offset
Ai7 Enabled Test Flow
1 Measurement/3 Analyses
Input to A
-Measure Output 1
-Verify AC Voltage-Verify Frequency
-Verify DC Offset
One time capture, multiple analysis of waveform
UUT
Input Output
A 1
8/8/2019 Augmenting Legacy Ate
25/26
UUT Functional Testing Examples
Legacy Test Flow
3 Separate Sequential Tests
Input toA
-Measure/Verify Output 1
Input to B
-Measure/Verify Output 2
Input to C
-Measure/Verify Output 3
Ai7 Enabled Test Flow
3 Parallel Tests
Inputs to A, B, C (simultaneously)
-Measure /Verify Outputs 1,2,3
(simultaneously)
Parallel execution of independent test sequences
UUT
Inputs Outputs
A 1
B 2
C3
8/8/2019 Augmenting Legacy Ate
26/26
UUT Functional Testing Examples
Legacy Test Flow
1 Performance, 2 Diagnostic Tests
Input to A
-Measure/Verify Output 1
If NOGO, Input A
-Measure/Verify Testpoint x
If NOGO, Input A
-Measure/Verify Testpoint y
Ai7 Enabled Test Flow
1 Test captures Performance and
Diagnostic Information
Input to A
-Measure Output 1, Testpoints x & y
-Verify Output 1
If NOGO, verify Testpoint x
If NOGO, verify Testpoint y
Diagnostic pre-fetch of fault isolation data
UUT
Input Output
A 1
x
yTestpoints