[email protected] www.zeiss.com/asb1detector 400 nm 4 µm ZEISS 1-Channel-AsB Detector Resolve Pure Material Contrast from Your Field Emission Scanning Electron Microscope (FE-SEM) Higher Productivity and Versatility • Faster image acquisition and through- put for automated sample runs • High long term and temperature stability • Clear, noise free imaging at low accelerating voltages • Expanded range of applications by selecting the collection of high and low angle BSE signals • Detection of Rutherford Back- scattered Electrons and Electron Channeling Pattern to caracterize crystalline samples Increase productivity and improve the image quality of your FE-SEM by retrofitting the new 1-Channel Angle selective Backscattered (AsB) Detector. Benefit from the high speed and increased sensitivity thanks to improved detector and electronics design. The new detector builds on the proven detection scheme of Angle selective Backscatter (AsB) Detector and is available for ZEISS SUPRA, ULTRA and 15×× systems. Ease of Use • Complete integration into the pole piece, no need to move in and out • Plug and play technology • No alignment to optical axis necessary • Safe Navigation prevents samples and stage from damaging detector • Seamless integration of software packages (e.g. SmartPI) in the workflow Higher Sensitivity and Resolution • Higher material, topographical and channeling contrast • Reduced noise and improved reso- lution compared to standard Solid State Backscattered Detector (BSD) • Increased signal-to-noise ratio thanks to improved diodes and electronics • Better separation of particles from bulk due to greater sensitivity at lower accelerating voltages EN_43_012_042 | CZ 01-2015