Top Down Method Vacuum Applications in Nanomanufacturing Author’s Note: Significant portions of this work have been reproduced and/or adapted with permission from material created by the Maricopa Advanced Technology Education Center, part of the Academic Affairs Division, Maricopa Community College District.
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Top Down Method Vacuum Applications in Nanomanufacturing Author’s Note: Significant portions of this work have been reproduced and/or adapted with permission.
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Top Down MethodVacuum Applications in Nanomanufacturing
Author’s Note: Significant portions of this work have been reproduced and/or adapted with permission from material created by the Maricopa Advanced Technology Education Center, part of the Academic
Affairs Division, Maricopa Community College District.
Vacuum Applications in Nanomanufacturing
• Objectives– To demonstrate the use of vacuum in
manufacturing processes– To quantify the need for vacuum conditions in
each process– To define the levels of vacuum present in the
process– To identify how these levels of vacuum are
attained and measured
Vacuum in Lithography Process
• Objective of Process – Create temporary features on silicon wafer to
guide etch and deposition processes– Role of Vacuum in Process
• Electron Beam Lithography– Exclude atmospheric gases from lithography chamber
to avoid particle collisions with beam and loss of energy– Eliminate secondary emission from particles that were
inadvertently “struck” through increased MFP– Extremely high vacuum level required (10-7 to 10-9 T)
Vacuum in Deposition Processes
• Objective of Process– Add new layers or substances to a defined region
of a silicon wafer– Physical Vapor Deposition
• Sputtering• Evaporation
– Chemical Vapor Deposition• LPCVD – Low Pressure Chemical Vapor Deposition• PECVD – Plasma Enhanced CVD
Vacuum in Physical Deposition
• Sputtering– A target material is hit by a high energy ion beam
of argon, dislodging particles of the species• Pressures of 5 – 10 mTorr• De-gas step at much higher vacuum (10-9 T) may be
used to remove oxide from target and drive off contaminants (vacuum provides a clean environment)
– Vacuum is key to process as it minimizing gas molecule collisions (Mean Free Path is larger) so ions are created
Vacuum in Physical Deposition
• Thermal Evaporation– A material is heated to its melting point in a
vacuum environment• Pressures of 10-3 Torr or lower may be required• Dependent on vapor pressure of the metal being used
– Vacuum environment lowers pressure in the chamber to allow vapors of the molten species to be escape and be deposited on the wafer surface
Vacuum in Chemical Deposition
• Chemical vapor deposition– LPCVD
• Low pressure CVD (0.1 – 1 Torr)• Deposits oxides nitrides, or polysilicon• Relatively high temperature process (>650 Deg C)
– UHVCVD – Ultra high vacuum (10 -9T)• Extremely High vacuum eliminates contaminants from reaching
surface
– PECVD - Plasma Enhanced CVD• Gas plasma used to control deposition rate
– Not possible to create a plasma at higher pressures due to mean free path being too short
– Electrons cannot gain enough energy without collision
Vacuum in The Etch Processes
• Objective– Remove material from a defined region of a
silicon wafer– Physical Etching
• Sputtering – Similar to deposition, but the “target” is the wafer! Less common today, but a low pressure method (<50mTorr)
• A purely physical process where ions from introduced gas in RF powered chamber bombard the surface
Vacuum in Etch Process (2)
• Plasma Etching– Vacuum is used to remove atmospheric gases
– Low pressure etchant gas such as CF4 is introduced into chamber where RF stream is flowing
– Gas breaks down into ions, electrons, and radicals
– CF4 dissasociates into CF3 + and F radical, which attacks silicon causing etching(2)
Vacuum in Ion Implantation
• Ion Implantation– Used to create conductive species in silicon– Creates the source and drain areas for
transistors and many other features– Ion beam of defined impurity is used– High Vacuum conditions are required to
• Ensure that no contaminant species exists• Increase mean free path so no collisions in ion beam
result
Vacuum Environments
• Creation of different vacuum levels requires different components– Pumping systems– Piping
• All valves are initially CLOSED• Soft start valve OPENS• Chamber pumps down for 60 seconds• Soft start valve CLOSES• Rough Valve OPENS• Chamber pumps down to 100 mT• Rough Valve CLOSES• Hi Vac Valve OPENS• Ion Gauge turns ON• Chamber pumps down to base pressure • Process begins at operating pressure
From MATEC Module 101
Pumpdown Sequence
• Two different pump types are used
– Rotary Vane type for rough vacuum• Rotary vane pump is a positive displacement pump• Prior to the rotary vane pump reaching its “ultimate pressure”
(pressure at which its pumping speed goes to 0), the sequence shuts it off and the valve is closed to avoid backstreaming oil from the input.
• Crossover pressure is where this takes place
– Cryo pump for high vacuum• Cryo Pump is an entrapment type pump
– Contaminant particles are captured on its inside walls through use of very low temperatures
– Periodically Cryo pumps must be regenerated
How Can We Measure Vacuum?
• To ascertain the pressure level, gauges of different types are used– Direct gauges use pressure from the gas to
deflect a needle or move a column of mercury or other liquid
– Indirect gauges use principles of heat transfer or electrical changes that take place based on the number of gas molecules present
– Both processes are gas type dependent
Vacuum Gauges –Direct Type
• Mechanical gauges such as the diaphragm gauge shown here are usable for rough vacuum. Pressure from the gas deflects the diaphragm
Vacuum Gauges - Indirect
• Indirect gauges such as the thermocouple gauge are usable for rough to medium vacuum levels where direct pressure is too low to mechanically deflect a gauge.
From MATEC Module 99 www.matec.org
Vacuum Gauges - Indirect
• Ionization gauges are useful for high vacuum measurement. where direct pressure is too low to mechanically deflect a gauge.
From MATEC Module 101
Typical Ranges of Gauges
From MATEC Module 101
Sources and References
(1)http://www.pfonline.com/articles/069901.html
(2) SS 11.26 Introduction to Semiconductor Manufacturing, Hong Xaio, Prentice Hall, Upper Saddle River, NJ C 2001
Maricopa Advanced Technology Education Center Module 101 Narrative C(2006)