Surface Physics Research at the Centro Atómico Bariloche (since 1987 to 2001) People Dr. Hugo Ascolani Dr. Oscar Grizzi Dr. Esteban A. Sánchez Dr. Guillermo Zampieri Dra. María L. Martiarena Dr. Víctor H. Ponce Dr. Julio E. Gayone (postdoc) Lic. Silvina Bengió (PhD student) Lic. L. De Ferrariis (PhD student) Gonzalo Otero (student) Publications: 60 in international journals (since 1996) Invited talks: 10 (since 1996) PhD thesis: 8 (since 1987) Budget: $250,000 (since 1996)
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Surface Physics Research at the Centro Atómico Bariloche (since 1987 to 2001)
People Dr. Hugo Ascolani Dr. Oscar Grizzi Dr. Esteban A. Sánchez Dr. Guillermo Zampieri Dra. María L. Martiarena Dr. Víctor H. Ponce Dr. Julio E. Gayone (postdoc) Lic. Silvina Bengió (PhD student) Lic. L. De Ferrariis (PhD student) Gonzalo Otero (student). - PowerPoint PPT Presentation
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Surface Physics Research at the Centro Atómico Bariloche(since 1987 to 2001)
People
Dr. Hugo AscolaniDr. Oscar GrizziDr. Esteban A. SánchezDr. Guillermo Zampieri
Dra. María L. MartiarenaDr. Víctor H. Ponce
Dr. Julio E. Gayone (postdoc)Lic. Silvina Bengió (PhD student)Lic. L. De Ferrariis (PhD student)Gonzalo Otero (student)
Publications: 60 in international journals (since 1996)Invited talks: 10 (since 1996)PhD thesis: 8 (since 1987)Budget: $250,000 (since 1996)
Intrinsic properties of materials
•Characterization of surfaces by ion scattering
•Characterization of surfaces by photoemission
•Electronic properties of perovskites
•Characterization of hard amorphous carbon films.
Interaction of electrons and ions with surfaces.
•Excitation of phonons in medium-energy electron spectroscopies.
•Inelastic processes in ion-surface collisions
•Modifications of surfaces by ion bombardment
Surface Characterization by TOF-ISSG. Otero, J.E. Gayone, E.A. Sánchez, O. Grizzi
Collaboration with Surface Physics Group of Santa Fe (INTEC) - Argentina
• Surface Reconstruction
• Adsorption Kinetics
• Adsorption sites
• Thin film growth
• Charge exchange
H
(d)
0 10 200
H:GaAs
CleanGaAs
1
c2
c
1
c
Ne
I BS(A
s)
(arb
.un
its)
INCIDENT ANGLE (deg)
6 70
CO
UN
TS
(a)
TIME OF FLIGHT (s)
[100]
[110] 5.65 Å
= -64.7o
AsGa
(b)
Hydrogen adsorption on GaAs(110)
After H adsorption, the substrate atoms move backto bulk positions and the As atoms become shadowedby their Ga neighbours.
(c)
Charge Fractions in Cs/GaAs
0.00 0.05 0.10 0.15 0.20 0.25 0.30
0
20
40
60
80
100
Charge fractions in Cs/GaAs(110)
5 keV Kr+ -> Cs / GaAs
As-
As+
Ga+
Cs+
DR
Ion
Fra
ctio
ns (%
)
Cs Coverage (ML)
Growth of AlF3 on GaAs(110)
4 8 12 16
FS Ga
FS As
DR AsDR Ga
MC
AlF
Substratetemperature
cleansurface
RT
250oC
400oC
Cou
nts (a
rb. u
nits)
Time of flight (s)30 60 640 680
250oC
FAl0GaAl+3As
dN(E
) / d
E (a
rb. u
nits)
Substratetemperature
400oC
RT
cleansurface
Auger energy (eV)
Intrinsic properties of materials
•Characterization of surfaces by ion scattering
•Characterization of surfaces by photoemission
•Electronic properties of perovskites
•Characterization of hard amorphous carbon films.
Interaction of electrons and ions with surfaces.
•Excitation of phonons in medium-energy electron spectroscopies.
•Inelastic processes in ion-surface collisions
•Modifications of surfaces by ion bombardment
Atom and molecule adsorption on semiconductor surfacesSilvina Bengió and Hugo Ascolani
Collaboration: M.C. Asensio, spanish-french beam-line at LURE, Orsay, France.