SRAM

SRAM

Mohammad Sharifkhani

Effect of Mismatch

Data Retention Voltage

DRV Mote-carlo simulation

Inv. with VL Input @ Read load

Inv. with VR Input @ Write load

Init cond. VL=1, VH=0

Shmoo plot

• A shmoo plot is a graph that represents how a particular test passes or fails when parameters like frequency, voltage, or temperature are varied and the test is executed repeatedly.

• The shape of the failing region is meaningful and helps in determining the cause of the failure.

• A shmoo plot of normal circuit operation shows better high-frequency performance as supply voltage increases, as shown in Fig. 1a.

• Other shapes frequently seen include the curlback (Fig. 1b), ceiling (Fig. 1c), floor (Fig. 1d), wall (Fig. 1e), finger (Fig. 1f), and breaking wave (Fig. 1g).

Techniques for improving reliability

• Read assist circuits

• Write assist circuits

• Error correction methods

Multiple voltages for NM improvement

Threshold voltage variation

S. Mukhopadhyay, JSSC 2007

Monte-carlo simulationAccess (reductionin the BL-differential produced), Higher Vt lower BL swing

Read (data flipping while reading), lower v-trip

write (unsuccessful write) Higher Vt weaker PU ration

hold (data flipping at a lower supply voltage in standby mode)

Solution: Adaptive body bias

Dynamic VDD Selection

Higher write noise margin more power

Read Write-assist circuitsKeeps WL voltage in check (lower for stable read)

Charge redistribution between cell VDD and down Vdd

Pulsed WL and BL

Minimization of WL activation

Threats write:Read Modify Write is used for all columns

Pulsed WL and BL

On pseudo read columns the BLs are precharged to a lower voltage than VDD to maintain stability of the cell Weaker access lower delta V to trip the cell

Dynamic Body Bias

Forward BB: stronger PMOS makes a wider butter fly curve more SNM during read operationHigher leakage (only applied on selected banks)

On-chip programmable voltage generator with N-well resistors

Read assist

Pilo, JSSC’07 Divided BLs

Local SA

Read assist

When enabled the half selected BL/read BL get full swing

Masks the BL of the half selected columns that do not need full amplification to save power

10% more power at nominal voltageYet allows for 1.20.9 VDD reduction and keeps the array stable saves power at the endMask registers are

loaded during power up

Write assistWeaker PMOS is needed

Supply reduction of the to be written cells by ~200mV

Only the columns to be written on get the lower supply voltage: a power decoder is needed

Reference generator

Write voltageBi-directional/data dependent current flow

Old data: VDDVWR

New data: sink data from VWR to charge up the new 1 node

Writing old data pulls up VWR push-pull is needed at Ref. Generator

Redundancy in SRAMs

Redundancy

Error Correction Code

Multi-bit errors

Multi-bit errors: Interleaving

Future trends

• More than 6T cells

• Change in technology

• eDRAM

More transistors

Thin Body MOSFETs

Double Gate FinFET

Double Gate vs. Tri-Gate

Independent Gate operation

Applications

Independent Gate Operation6-T SRAM in Bulk-Si

6T SRAM with FinFET

6T SRAM with 2 FinFET

Embedded DRAM