Top Banner
R esistivity M easurement S ystems Touch Screen Insulation Resistance www.dasoleng.com Silicon Wafer Solar Cell Metal Resistivity
12

Resistivity Measurement Systems

Apr 14, 2022

Download

Documents

dariahiddleston
Welcome message from author
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Page 1: Resistivity Measurement Systems

Resistivity Measurement Systems

Touch Screen

Insulation Resistance

www.dasoleng.com

Silicon Wafer

Solar Cell

Metal Resistivity

Page 2: Resistivity Measurement Systems

1

Auto Station Z

Line Resistance Meter

- Z-Axis Auto-Repeat Measurement - Many Silicon Wafer Measurement - Size : 220(W) X 440(L) X 260(H) - Infinite Repeat System

- Four Electrode Method- Resistivity Meter : RS8-1G (1mΩ/sq. ~ 1GΩ/sq.)- Conductivity Measurement

Powder Resistance Tester(PC)- Resistivity Meter : RS8-1G (1mΩ/sq. ~ 1GΩ/sq.)- Load Cell : Max. 2t- Height Gage : Mitutoyo products- PC Connection System

Page 3: Resistivity Measurement Systems

2

Powder Resistance Tester(Manual)

Electric Conductor Tester

- Resistivity Meter : RS8-1G (1mΩ/sq. ~ 1GΩ/sq.)- Load Cell : Max. 2t- Height Gage : Mitutoyo products

- Coating Sheet Check- Use the buzzer and the ramp- Measuring the buzzer rings- Use 9V battery

Metal Resistivity- Four Electrode Method- Resistivity Meter : RS8-1G (1mΩ/sq. ~ 1GΩ/sq.)- Resistivity & Conductivity Measurement

Page 4: Resistivity Measurement Systems

3

Portable Type

① Specification ◇ Measurement Method : Dual Configuration Method ◇ Model (Only Sheet Resistance) FPP-400 : 4 mΩ/sq. ~ 450 Ω/sq. FPP-2000 : 2 Ω/sq. ~ 2000 Ω/sq. FPP-2400 : 40 mΩ/sq. ~ 4000 Ω/sq. FPP-40k : 0.4 Ω/sq. ~ 40 kΩ/sq. ◇ Measurement Resolution : 3½ digits ◇ Measurement Accuracy : ±1.0% of reading ◇ Pin spacing : 1.00㎜ ~ 5.00㎜ ◇ Pin Radius : 100㎛ ~ 700㎛ ◇ Measurement Time : 1 sec ◇ Size : Main body(Width : 92㎜, Length : 165㎜, Thickness 30㎜)

② Environment ◇ Temperature : 23 ± 5℃ ◇ Humidity : 30 ~ 70%

③ Electric Power (Internally Charged Battery) ◇ Adapter Rated Input : AC 100V ~ 240V, 50 ~ 60㎐ ◇ Adapter Rated Output : DC 12V

Sample Size : 300㎜ × 300㎜

XYZ-axis manual moving system

Sample Size : Ø200㎜

Z-axis manual measurement

Option - Station

Station은 Probe를 본 Station에 간단하게 부착하여 사용하는 것으로 주로 연구 분석용으로재현성이 요구되거나 측정 시료가 작아서 측정이 곤란한 경우 사용하는 장치입니다.

Use : Touch Screen, Solar Cell

Page 5: Resistivity Measurement Systems

4

Resistivity Meter

Resistivity MeterModel - RS8(1G)① Features ◇ Single, Dual, Mono, Bulk Mode Measurement Selection. ◇ Direct Ω , S/㎝ , Ω/sq. , Ω·㎝ Conversion. ◇ Bulk mode for solar cell bulk type material. ◇ Very flexible and customized probe needle and measurement unit. (Probe tension, probe radius, probe interval)

② Specification ◇ Measurement Method : Single & Dual Configuration Method ◇ Model : 1 mΩ/sq. ~ 1 GΩ/sq. ◇ Measurement Resolution : 4½ digits ◇ Measurement Accuracy : ±1.0% of reading ◇ Pin spacing : 1.00㎜ ~ 5.00㎜ ◇ Pin Radius : 100㎛ ~ 700㎛ ◇ Measurement Time : 1 sec ◇ Source current Range : 10nA ~ 100mA

③ Environment ◇ Temperature : 23 ± 5℃ ◇ Humidity : 30 ~ 70%

④ Electric Power ◇ Rated Input : AC 100V ~ 240V, 50 ~ 60㎐

Model - HS8(40k, 1G)

① Features ◇ Single, Dual, Bulk Mode Measurement Selection. ◇ Direct Ω , Ω/sq. , Ω·㎝ Conversion. ◇ Bulk mode for solar cell bulk type material. ◇ Very flexible and customized probe needle and measurement unit. (Probe tension, probe radius, probe interval)

② Specification ◇ Measurement Method : Single & Dual Configuration Method ◇ Model HS8-40k : 10 mΩ/sq. ~ 40 kΩ/sq. HS8-1G : 1 kΩ/sq. ~ 1 GΩ/sq. ◇ Measurement Resolution : 3½ digits ◇ Measurement Accuracy : ±1.0% of reading ◇ Pin spacing : 1.00㎜ ~ 5.00㎜ ◇ Pin Radius : 100㎛ ~ 700㎛ ◇ Measurement Time : 1 sec ◇ Source current Range : 10nA ~ 100mA

③ Environment ◇ Temperature : 23 ± 5℃ ◇ Humidity : 30 ~ 70%

④ Electric Power ◇ Adapter Rated Input : AC 100V ~ 240V, 50 ~ 60㎐ ◇ Adapter Rated Output : DC 12V

Page 6: Resistivity Measurement Systems

5

Automatic Type

① Features

1) XYZ-Axis robot fully automatic moving system

2) Automatic resistance range selection

3) Measuring size(rectangle type)

: 600㎜ × 600㎜(user defined produce)

4) Perfect remote control by operation software

5) Data analysis uniformity, avg, max, min, 2D 3D-mapping, capture...

6) Specimen : thin film (ito, izo, lcd, touch panel, solar cell...)

7) Specimen vacuum holder & air blower unloading

② Specifications

1) Measuring method : contacted by 4-Point Probe

2) Configuration : single or dual (user chose)

3) Measuring Range sheet Resistance : 1mΩ/sq. ~ 1GΩ/sq.

4) Measurement accuracy ±0.5% (KRISS Standard wafer, when 23℃)

5) Measuring time : range search max. 6s search after actual 1s

6) 4-Point Probe pin spacing : 1.591㎜ increment(1.00, , 5.00)

7) Pin load 60g/pin ~ 200g/pin

8) Pin radius 50㎛ ~ 700㎛(order made/chose)

9) Tolerance : ±0.01㎜

10) Pin material : TH-tungsten or BC-beryllium copper

11) Serial communication : RS232C

③ Utility

1) Current source : 10㎁ ~ 100㎃

2) DVM 0.00V ~ 2.5V

3) Power requirements line voltage : AC 220V ±10%

4) Line frequency : 50㎐ ~ 60㎐

5) Temperature range : 23℃ ±5℃

6) Relative humidity : 30% ~ 70%

Use : Touch Screen, Solar Cell, Silicon Wafer Insulation Resistance

Page 7: Resistivity Measurement Systems

6

① Features

1) XY-Axis robot Z-Cylinder fully automatic moving system

2) Automatic resistance range selection

3) Measuring size(Circular type)

: Ø300㎜(user defined produce)

4) Perfect remote control by operation software

5) Data analysis

uniformity, avg, max, min, 2D 3D-mapping, capture...

6) Specimen : thin film

(ito, izo, lcd, solar cell...)

7) Specimen vacuum holder & air blower unloading

② Specifications

1) Measuring method : contacted by 4-Point Probe

2) Configuration : single or dual (user chose)

3) Measuring Range sheet Resistance : 1mΩ/sq. ~ 1GΩ/sq.

4) Measurement accuracy ±0.5% (KRISS Standard wafer, when 23℃)

5) Measuring time : range search max. 6s search after actual 1s

6) 4-Point Probe pin spacing : 1.591㎜ increment(1.00, , 5.00)

7) Pin load 60g/pin ~ 200g/pin

8) Pin radius 50㎛ ~ 700㎛(order made/chose)

9) Tolerance : ±0.01㎜

10) Pin material : TH-tungsten or BC-beryllium copper

11) Serial communication : RS232C

③ Utility

1) Current source : 10㎁ ~ 100㎃

2) DVM 0.00V ~ 2.5V

3) Power requirements line voltage : AC 220V ±10%

4) Line frequency : 50㎐ ~ 60㎐

5) Temperature range : 23℃ ±5℃

6) Relative humidity : 30% ~ 70%

Use : Solar Cell, Silicon Wafer, Touch Panel

Page 8: Resistivity Measurement Systems

7

Use : Cell Phone Glass, Touch Screen, Solar Cell

① Features1) XYY2Z-4Axis robot fully automatic moving system2) Automatic resistance range selection3) Measuring size(rectangle type) : user defined produce4) Perfect remote control by operation software5) Data analysis uniformity, avg, max, min, 2D-mapping, capture...6) Specimen : thin film (ito, izo, lcd, touch panel, solar cell...)7) Six-Head : Simultaneous Measurement System

② Specifications1) Measuring method : contacted by 4-Point Probe2) Configuration : single or dual (user chose)3) Measuring Range sheet Resistance : 1mΩ/sq. ~ 1GΩ/sq.4) Measurement accuracy ±0.5% (KRISS Standard wafer, when 23℃)5) Measuring time : range search max. 6s search after actual 1s6) 4-Point Probe pin spacing : 1.591㎜ increment(1.00, , 5.00)7) Pin load 60g/pin ~ 200g/pin8) Pin radius 50㎛ ~ 700㎛(order made/chose)9) Tolerance : ±0.01㎜10) Pin material : TH-tungsten or BC-beryllium copper11) Serial communication : RS232C

③ Utility1) Current source : 10㎁ ~ 100㎃2) DVM 0.00V ~ 2.5V3) Power requirements line voltage : AC 220V ±10%4) Line frequency : 50㎐ ~ 60㎐5) Temperature range : 23℃ ±5℃6) Relative humidity : 30% ~ 70%

③ Utility1) Current source : 10㎁ ~ 100㎃2) DVM 0.00V ~ 2.5V3) Power requirements line voltage : AC 220V ±10%4) Line frequency : 50㎐ ~ 60㎐5) Temperature range : 23℃ ±5℃6) Relative humidity : 30% ~ 70%

① Features1) XYZ-Axis robot fully automatic moving system2) Automatic resistance range selection3) Measuring size(rectangle type) : 1300㎜ × 1300㎜(user defined produce)4) Perfect remote control by operation software5) Data analysis uniformity, avg, max, min, 2D 3D-mapping, capture...6) Specimen : thin film (ito, izo, lcd, touch panel, solar cell...)7) Specimen vacuum holder & air blower unloading

② Specifications1) Measuring method : contacted by 2-Point Probe2) Configuration : single3) Measuring Range Resistance : 1mΩ ~ 60MΩ4) Measurement accuracy ±0.5% (KRISS Standard wafer, when 23℃)5) Measuring time : range search max. 6s search after actual 1s6) 4-Point Probe pin spacing : 1.591㎜ increment(1.00, , 5.00)7) Pin load 60g/pin ~ 200g/pin8) Pin radius 50㎛ ~ 700㎛(order made/chose)9) Tolerance : ±0.01㎜10) Pin material : TH-tungsten or BC-beryllium copper11) Serial communication : RS232C

Use : Insulation Resistance, Solar Cell

Page 9: Resistivity Measurement Systems

8

③ Utility1) Current source : 10㎁ ~ 100㎃2) DVM 0.00V ~ 2.5V3) Power requirements line voltage : AC 220V ±10%4) Line frequency : 50㎐ ~ 60㎐5) Temperature range : 23℃ ±5℃6) Relative humidity : 30% ~ 70%

③ Utility1) Current source : 10㎁ ~ 100㎃2) DVM 0.00V ~ 2.5V3) Power requirements line voltage : AC 220V ±10%4) Line frequency : 50㎐ ~ 60㎐5) Temperature range : 23℃ ±5℃6) Relative humidity : 30% ~ 70%

Intuitive Software

[2D Graph] [3D Graph]

Auto Meter Measurement Screen

Page 10: Resistivity Measurement Systems

9

Measurement Principal

① Single Configuration Method. (Config. A)

【 】

F2(D) : Sample size correction factor for the probe spacing

F(t/S) : Sample thickness and probe calibration factor for the interval

Fsp : Correction factor for the probe spacing

② Dual Configuration Method.(Config. A & B)

Rs Equation of Single & Dual configuration method

Page 11: Resistivity Measurement Systems

10

Uniformity & Edge effects

<Box Type> <Cylinder Type> <Custom & Pen Type>

Comparison : Single & dual Configuration

Various 4 Point Probe

Page 12: Resistivity Measurement Systems